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TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
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Authors
Tallarico, A. N.
;
Millesimo, M.
;
Bakeroot, Benoit
;
Borga, Matteo
;
Posthuma, Niels
;
Decoutere, Stefaan
;
Sangiorgi, E.
;
Fiegna, C.
DOI
10.1109/TED.2021.3134928
ISSN
0018-9383
Issue
2
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume
69
Title
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
Publication type
Journal article
Embargo date
2022-02-28
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2
20.500.12860/38693.2
*
2022-02-02T11:24:38Z
validation by library/open access desk
1
20.500.12860/38693
2022-01-01T02:06:30Z
*Selected version
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