Browsing by author "Van Der Biest, O."
Now showing items 1-14 of 14
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Assessment of quantitative characterization of localized strain using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman (1997) -
Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Crystalline silicon thin-film solar cells on foreign substrates: the European project meteor
Gall, S.; Schneider, J.; Klein, J.; Muske, M.; Rau, B.; Conrad, E.; Sieber, I.; Fuhs, W.; Ornaghi, Carlo; Van Gestel, Dries; Gordon, Ivan; Van Nieuwenhuysen, Kris; Beaucarne, Guy; Poortmans, Jef; Stoger-Pollach, M.; Bernardi, J.; Schattschneider, P.; Wang, Y.; Van Der Biest, O. (2004) -
Crystallisation and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films
Zhao, Chao; Roebben, G.; Heyns, Marc; Van Der Biest, O. (2002) -
Effect of crystallization ambient on orientation selection in Sol-Gel derived Pb(Zr,Ti)O-3 thin films on Pt electrode layers
Fè, Laura; Vasiliu, Florin Dan; Norga, Gerd; Wouters, Dirk; Van Der Biest, O. (2002) -
Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure
Janssens, Koenraad; Vanhellemont, Jan; Maes, Herman; Van Der Biest, O.; Hull, R. (1995) -
In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
Roebben, G.; Zhao, Chao; Duan, R. G.; Vleugels, J.; Heyns, Marc; Van Der Biest, O. (2002) -
Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R.; Bean, J. C. (1995) -
Miscibility of amorphous ZrO2-Al2O3 binary alloy
Zhao, Chao; Richard, Olivier; Bender, Hugo; Caymax, Matty; De Gendt, Stefan; Heyns, Marc; Young, Edward; Roebben, G.; Van Der Biest, O.; Haukka, S. (2002) -
Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
Role of fluorite formation in orientation selection in sol-gel derived Pb(Zr,Ti)O3 films on Pt electrode layers
Norga, Gerd; Fè, Laura; Vasiliu, Florin Dan; Wouters, Dirk; Van Der Biest, O. (2002) -
Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited
Janssens, Koenraad; Van Der Biest, O.; Vanhellemont, Jan; Maes, Herman; Hull, R. (1995) -
Structural characterization of ALCVD ZrO2/Al2O3 nano-laminate deposits with high temperature grazing incidence XRD and TEM
Zhao, Chao; Richard, Olivier; Maes, Jos; Roebben, G.; Bender, Hugo; De Gendt, Stefan; Caymax, Matty; Vandervorst, Wilfried; Heyns, Marc; Van Der Biest, O. (2002) -
The effect of Pb stoichiometry on switching behavior of Pt/PZT/Pt ferroelectric capacitors
Norga, Gerd; Maes, Jos; Coppye, Erwin; Fè, Laura; Wouters, D.; Van Der Biest, O. (2000)