Browsing by author "Van der Biest, O."
Now showing items 1-14 of 14
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Antimony induced crystallization of amorphous silicon
Wang, Y.; Van der Biest, O.; Gordon, Ivan; Van Gestel, Dries; Beaucarne, Guy; Poortmans, Jef; Stoger-Pollach, M.; Schattschneider, P.; Gall, S. (2005) -
Characterization of nano-laminate structure using grazing incidence XRD and ATR-FTIR
Zhao, Chao; De Gendt, Stefan; Caymax, Matty; Heyns, Marc; Cosnier, Vincent; Maes, Jan; Roebben, G.; Van der Biest, O. (2003) -
Crystallization and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films
Zhao, Chao; Roebben, G.; Heyns, Marc; Van der Biest, O. (2001) -
Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks
Zhao, Chao; Richard, Olivier; Bender, Hugo; Houssa, Michel; Carter, Richard; De Gendt, Stefan; Heyns, Marc; Young, Edward; Tsai, Wilman; Roebben, G.; Van der Biest, O.; Haukka, S. (2001) -
Effect of Pb stoiciometry on switching behavior of sol-gel prepared PZT thin films
Norga, Gerd; Fè, Laura; Wouters, Dirk; Maes, J.; Van der Biest, O. (1999) -
In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction
Zhao, Chao; Roebben, G.; Bender, Hugo; Young, Edward; Haukka, S.; Houssa, Michel; Naili, Mohamed; De Gendt, Stefan; Heyns, Marc; Van der Biest, O. (2001) -
In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
Roebben, G.; Zhao, Chao; Duan, R. G.; Vleugels, J.; Heyns, Marc; Van der Biest, O. (2001) -
Influence of Pr doping and oxygen deficiency on the scattering behavior of YBa2Cu3 O7 thin films
François, Isabel; Jaekel, C.; Kyas, G.; Dierickx, D.; Van der Biest, O.; Heeres, Rob M.; Moshchalkov, V. V.; Bruynseraede, Y.; Roskos, H. G.; Borghs, Gustaaf; Kurz, H. (1996) -
Localised Strain Characterization in Semiconductor Structures using Electron Diffraction Contrast Imaging
Janssens, Koenraad; Van der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
On the characterization of the strain field of lattice defects in silicon with nanometer resolution
Janssens, Koenraad; Van der Biest, O.; Vanhellemont, Jan; Maes, Herman (1994) -
Role of fluorite phase formation in the texture selection of sol-gel-prepared Pb(Zr1-x,Ti-x)O-3 films on Pt electrode layers
Norga, Gerd; Vasiliu, F.; Fè, Laura; Wouters, Dirk; Van der Biest, O. (2003) -
Stabilization of amorphous structures in ALCVD high-k oxide layers
Zhao, Chao; Richard, Olivier; Bender, Hugo; Young, Edward; Carter, Richard; Tsai, Wilman; Caymax, Matty; De Gendt, Stefan; Heyns, Marc; Roebben, G.; Van der Biest, O.; Maes, Jos; Tuominen, Marko; Haukka, S. (2001) -
The role of TiO in the perovskite nucleation and (111) orientation selection in sol-gel PZT layers
Vasiliu, F.; Norga, G.J.; Fe, L.; Wouters, Dirk; Van der Biest, O. (2003) -
Thermal stability of high k layers
Zhao, Chao; Cosnier, V.; Chen, P.J.; Richard, Olivier; Roebben, G.; Maes, Jan; Van Elshocht, Sven; Bender, Hugo; Young, Edward; Van der Biest, O.; Caymax, Matty; Vandervorst, Wilfried; De Gendt, Stefan; Heyns, Marc (2003)