Browsing by imec author "823a379c6cab91e5056929f33191723c3b43ad66"
Now showing items 61-80 of 106
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Investigations of the surface chemical composition and atomic structure of ex-situ sulfur passivated Ge(100)
Fleischmann, Claudia; Sioncke, Sonja; Schouteden, K.; Paredis, K.; Beckhoff, B.; Müller, M.; Kolbe, M.; Meuris, Marc; Van Haesendonck, C.; Temst, K.; Vantomme, Andre (2009) -
Laser-assisted atom probe tomography of semiconductors: the impact of the focused-ion beam specimen preparation
Bogdanowicz, Janusz; Kumar, Arul; Fleischmann, Claudia; Gilbert, Matthieu; Houard, Jonathan; Vella, Angela; Vandervorst, Wilfried (2018) -
Liquid-phase adsorption of sulfur on germanium: reaction mechanism and atomic geometry
Fleischmann, Claudia; Houssa, Michel; Müller, Matthias; Beckhoff, Burkhard; Boyen, Hans-Gerd; Meuris, Marc; Temst, Kristiaan; Vantomme, Andre (2013) -
Nanoscale localisation of an atom probe tip through electric field mapping
Op de Beeck, Jonathan; Fleischmann, Claudia; Vandervorst, Wilfried; Paredis, Kristof (2020) -
NEXAFS characterization of inorganic and organic materials for semiconductor application
Fleischmann, Claudia; Hoenicke, Philipp; Hermann, Peter; Mueller, Matthias; Beckhoff, Burkhard; Voroshazi, Eszter; Conard, Thierry; Vandervorst, Wilfried (2014) -
Non stoichiometric atom emission from bulk InP under green and UV laser illumination
Morris, Richard; Arnoldi, Laurent; Fleischmann, Claudia; Bogdanowicz, Janusz; Vandervorst, Wilfried (2016) -
(Non-hemispherical) apex shape formation and (non-uniform) apex temperature distribution during laser-assisted atomprobe tomography of semiconductors
Bogdanowicz, Janusz; Kumar, Arul; Melkonyan, Davit; Arnoldi, Laurent; Fleischmann, Claudia; Morris, Richard; Vella, Angela; Gilbert, Matthieu; Jonathan, Houard; Vandervorst, Wilfried (2016) -
Off-axis Raman spectroscopy for nanoscale stress metrology
Khan, Zoheb; Nuytten, Thomas; Favia, Paola; Fleischmann, Claudia; De Wolf, Ingrid; Vandervorst, Wilfried (2022) -
Opportunities and challenges in APT metrology for semiconductor applications
Fleischmann, Claudia; Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Op de Beeck, Jonathan; Makhotkin, Igor; van der Heide, Paul; Vandervorst, Wilfried (2019) -
Optical investigations of PCDTBT-PC70BM blends for organic photovoltaics
Rosu, Dana; Hertwig, Andreas; Fleischmann, Claudia; Tait, Jeffrey; Beck, U. (2014) -
Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Cuduvally, Ramya; Morris, Richard; Oosterbos, Giel; Ferrari, Piero; Fleischmann, Claudia; Forbes, Richard G.; Vandervorst, Wilfried (2022) -
Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
Cuduvally, Ramya; Oosterbos, Giel; Morris, Richard; Fleischmann, Claudia; Ferrari, Piero; Scheerder, Jeroen; Vantomme, Andre; Vandervorst, Wilfried (2019) -
Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs
Cuduvally, Ramya; Morris, Richard; Ferrari, Piero; Bogdanowicz, Janusz; Fleischmann, Claudia; Melkonyan, Davit; Vandervorst, Wilfried (2020) -
Potential sources of inaccuracy for the composition quantification of InGaAs and InAlAs
Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Arnoldi, Laurent; Bogdanowicz, Janusz; Fleischmann, Claudia; Vandervorst, Wilfried (2017) -
Quantification of high-K nanolayers for semiconductor applications using synchrotron radiation and calibrated instrumentation
Mueller, Matthias; Hoenicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia; Vandervorst, Wilfried; Beckhoff, Burkhard (2014) -
Quantitative compositional analysis of compound semiconductors by atom probe tomography
Cuduvally, Ramya; Morris, Richard; Bogdanowicz, Janusz; Melkonyan, Davit; Arnoldi, Laurent; Fleischmann, Claudia; Vandervorst, Wilfried (2018) -
Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
Hoenicke, Philipp; Mueller, Matthias; Detlefs, Blanka; Fleischmann, Claudia; Beckhoff, Burkhard (2014) -
Reference-free, depth-dependent characterization of nanoscaled materials using a combined grazing incidence X-ray fluorescence and X-ray reflectometry approach
Hoenicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia; Vandervorst, Wilfried; Mueller, Matthias; Nolot, Emmanuel; Grampeix, Helen; Beckhoff, Burkhard (2015) -
Reference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis
Hoenicke, Philipp; Mueller, Matthias; Detlefs, Blanka; Fleischmann, Claudia; Beckhoff, Burkhard (2014) -
Resolving the 3D boron distribution in vertical Si nanowires using atom probe tomography
Melkonyan, Davit; Fleischmann, Claudia; Arnoldi, Laurent; Veloso, Anabela; Bogdanowicz, Janusz; Morris, Richard; Vandervorst, Wilfried (2017)