Browsing by author "Scholz, Mirko"
Now showing items 21-40 of 117
-
Characterization and modeling of diodes in sub-45 nm CMOS technologies under HBM stress conditions
Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Tremouilles, David; Sawada,; Nakaei,; Hasebe,; Groeseneken, Guido (2007) -
Characterization and optimization of sub-32nm FinFET devices for ESD applications
Thijs, Steven; Tremouilles, David; Russ, Christian; Griffoni, Alessio; Collaert, Nadine; Rooyackers, Rita; Linten, Dimitri; Scholz, Mirko; Duvvury, Charvaka; Gossner, Harald; Jurczak, Gosia; Groeseneken, Guido (2008) -
Charged device model (CDM) ESD challenges for laterally diffused nMOS (nLDMOS) silicon controlled rectifier (SCR) devices for high-voltage applications in standard low-voltage CMOS technology
Griffoni, Alessio; Chen, Shih-Hung; Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Groeseneken, Guido (2010) -
Closing the design gap between system-level and component-level Electro Static Discharge (ESD)
Scholz, Mirko (2013-05) -
Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems
Scholz, Mirko; Chen, Shih-Hung; Vandersteen, Gerd; Linten, Dimitri; Hellings, Geert; Sawada, Masanori; Groeseneken, Guido (2013) -
Concise analytical expression for Wunsch-Bell 1-D pulsed heating and applications in ESD using TLP
Hellings, Geert; Roussel, Philippe; Wang, Nian; Boschke, Roman; Chen, Shih-Hung; Simicic, Marko; Scholz, Mirko; Steudel, Soeren; Myny, Kris; Linten, Dimitri; Hellings, Paul; Ashif, Nowab (2019) -
Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques
Linten, Dimitri; Ji, Zhigang; Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Alian, AliReza; Collaert, Nadine; Thean, Aaron (2015) -
Design methodology for FinFET GG-NMOS ESD protecction devices
Thijs, Steven; Russ, Christian; Tremouilles, David; Linten, Dimitri; Scholz, Mirko; Jurczak, Gosia; Collaert, Nadine; Rooyackers, Rita; Duvvury, Charvaka; Gossner, Harald; Groeseneken, Guido (2008-05) -
Design methodology of FinFET devices that meet IC-level HBM ESD targets
Thijs, Steven; Russ, Christian; Tremouilles, David; Linten, Dimitri; Scholz, Mirko; Jurczak, Gosia; Collaert, Nadine; Rooyackers, Rita; Sawada, M; Nakaei, T; Hasebe, T; Duvvury, Charvaka; Gossner, Harald; Groeseneken, Guido (2008-09) -
Electrical and thermal scaling trends for SOI FinFET ESD design
Thijs, Steven; Tremouilles, David; Griffoni, Alessio; Russ, Christian; Linten, Dimitri; Scholz, Mirko; Collaert, Nadine; Rooyackers, Rita; Duvvury, Charvaka; Groeseneken, Guido (2009) -
Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs
Griffoni, Alessio; Thijs, Steven; Russ, Christian; Tremouilles, David; Linten, Dimitri; Scholz, Mirko; Simoen, Eddy; Claeys, Cor; Meneghesso, Gaudenzio; Groeseneken, Guido (2010) -
Emerging challenges of ESD protections in FinFET technologies
Chen, Shih-Hung; Linten, Dimitri; Hellings, Geert; Scholz, Mirko; Groeseneken, Guido (2013) -
ESD ballasting of Ge Finfet ggNMOS devices
Boschke, Roman; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Groeseneken, Guido (2017) -
ESD Challenges in sub-10nm CMOS technologies
Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Hellings, Geert; Boschke, Roman; Horiguchi, Naoto (2016) -
ESD characterization of a-IGZO TFTs on Si and foil substrates
Wang, Nian; Chen, Shih-Hung; Hellings, Geert; Myny, Kris; Steudel, Soeren; Scholz, Mirko; Boschke, Roman; Linten, Dimitri; Groeseneken, Guido (2017) -
ESD characterization of gate-all-around (GAA) Si nanowire devices
Chen, Shih-Hung; Hellings, Geert; Linten, Dimitri; Veloso, Anabela; Scholz, Mirko; Boschke, Roman; Groeseneken, Guido; Thean, Aaron (2015) -
ESD characterization of germanium ESD devices
Boschke, Roman; Linten, Dimitri; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Mitard, Jerome; Mertens, Hans; Witters, Liesbeth; Van Campenhout, Joris; Verheyen, Peter; Pogany, Dionyz; Groeseneken, Guido (2014-09) -
ESD characterization of germanium FinFET diodes and ggMOS
Boschke, Roman; Linten, Dimitri; Chen, Shih-Hung; Scholz, Mirko; Hellings, Geert; Mitard, Jerome; Witters, Liesbeth; Groeseneken, Guido (2015) -
ESD characterization – standards, challenges and trends (Tutorial)
Scholz, Mirko; Thijs, Steven; Linten, Dimitri (2009) -
ESD diodes in Bulk Si gate-all-around vertically stacked horizontal nanowire technology
Chen, Shih-Hung; Hellings, Geert; Scholz, Mirko; Linten, Dimitri; Mertens, Hans; Ritzenthaler, Romain; Boschke, Roman; Groeseneken, Guido; Horiguchi, Naoto (2016)