Browsing by author "Croon, Jeroen"
Now showing items 1-19 of 19
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A 0.35μm SiGe BiCMOS process featuring a 80 GHz Fmax HBT and integrated high-Q RF passive components
Decoutere, Stefaan; Vleugels, Frank; Kuhn, Rudiger; Loo, Roger; Caymax, Matty; Jenei, Snezana; Croon, Jeroen; Van Huylenbroeck, Stefaan; Da Rold, Martina; Rosseel, Erik; Chevalier, P.; Coppens, P. (2000) -
A comparison of extraction techniques for threshold voltage mismatch
Croon, Jeroen; Tuinhout, Hans; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, Stefaan; Maes, Herman; Sansen, Willy (2002) -
A general model for MOS transistor matching
Croon, Jeroen; Rosmeulen, Maarten; Van Huylenbroeck, Stefaan; Decoutere, Stefaan (1999) -
A simple and accurate deep submicron mismatch model
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2000) -
A simple characterization method for MOS transistor matching in deep submicron technologies
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2001) -
A yield-aware modeling methodology for nano-scaled SRAM designs
Grossar, Evelyn; Croon, Jeroen; Stucchi, Michele; Dehaene, Wim; Maex, Karen (2005) -
An easy-to-use mismatch model for the MOS transistor
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2002) -
CMOS device optimisation for mixed-signal technologies
Stolk, Peter; Tuinhout, Hans; Duffy, Ray; Augendre, Emmanuel; Bellefroid, L. P.; Bolt, M. J. B.; Croon, Jeroen; Dachs, Charles; Huisman, F. R. J.; Moonen, A. J.; Ponomarev, Youri; Roes, R. F. M.; Da Rold, Martina; Seevinck, E.; Sreerambhatla, K. N.; Surdeanu, Radu; Velghe, Rudolf; Vertregt, M.; Webster, M. N.; van Winkelhoff, N. K. J.; Zegers-Van Duijnhoven, A. T. A. (2001) -
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Croon, Jeroen; Kaczer, Ben; Lujan, Guilherme; Kubicek, Stefan; Groeseneken, Guido; Meuris, Marc (2004) -
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Croon, Jeroen; Kaczer, Ben; Lujan, Guilherme; Kubicek, Stefan; Groeseneken, Guido; Meuris, Marc (2005-04) -
Experimental investigation of the impact of line-edge roughness on MOSFET performance and yield
Croon, Jeroen; Leunissen, Peter; Jurczak, Gosia; Benndorf, Michael; Rooyackers, Rita; Ronse, Kurt; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2003) -
Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K range
Croon, Jeroen; Biesemans, Serge; Kubicek, Stefan; Simoen, Eddy; De Meyer, Kristin; Claeys, Cor (1997) -
Full spectral analysis of line edge roughness
Leunissen, Peter; Lorusso, Gian; Ercken, Monique; Croon, Jeroen; Yang, H.; Azordegan, A.; DiBiase, Tony (2005) -
Ge deep sub-micron pFETs with etched TaN metal gate on a High-K dielectric, fabricated in a 200mm silicon prototyping line
De Jaeger, Brice; Houssa, Michel; Satta, Alessandra; Kubicek, Stefan; Verheyen, Peter; Van Steenbergen, Jan; Croon, Jeroen; Kaczer, Ben; Van Elshocht, Sven; Delabie, Annelies; Kunnen, Eddy; Sleeckx, Erik; Teerlinck, Ivo; Lindsay, Richard; Schram, Tom; Chiarella, Thomas; Degraeve, Robin; Conard, Thierry; Poortmans, Jef; Winderickx, Gillis; Boullart, Werner; Schaekers, Marc; Mertens, Paul; Caymax, Matty; Vandervorst, Wilfried; Van Moorhem, Els; Biesemans, Serge; De Meyer, Kristin; Ragnarsson, Lars-Ake; Lee, S.; Kota, G.; Raskin, G.; Mijlemans, P.; Autran, J.L.; Afanas'ev, V.; Stesmans, A.; Meuris, Marc; Heyns, Marc (2004) -
Impact of LER and CDU on device performance
Leunissen, Peter; Lorusso, Gian; Ercken, Monique; Croon, Jeroen; Jurczak, Gosia; Zhang, Wenqi; Wu, W.; Yang, H.; Azordegan, A.; DiBiase, T. (2005) -
Influence of doping profile and halo implantation on the threshold voltage mismatch of a 0.13μm CMOS technology
Croon, Jeroen; Augendre, Emmanuel; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2002) -
Line edge roughness: characterization, modeling and impact on device behavior
Croon, Jeroen; Storms, Greet; Winkelmeier, Stephanie; Pollentier, Ivan; Ercken, Monique; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2002) -
Matching properties of deep sub-micron MOS transistors
Croon, Jeroen (2004-06) -
Physical modeling and prediction of the matching properties of MOSFETs
Croon, Jeroen; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2004)