Browsing by author "Cerbu, Dorin"
Now showing items 1-12 of 12
-
Controlled electromigration to explore superconductivity at the nanoscale
Van de Vondel, Joris; Bauman, Xavier; Cerbu, Dorin; Adami, O.-A.; Zharinov, V.; Verellen, Niels; Papari, G.; Moshchalkov, Victor; Silhanek, Alejandro (2015) -
Impact of local variability on defect-aware process windows
Maslow, Mark John; Yaegashi, Hidetami; Frommhold, Andreas; Schiffelers, Guido; Wahlisch, Felix; Rispens, Gijsbert; Slachter, Bram; Yoshida, Keisuke; Hara, Arisa; Oikawa, Noriaki; Pathak, Abhinav; Cerbu, Dorin; Hendrickx, Eric; Bekaert, Joost (2019) -
Machine Learning on Multiplexed Optical Metrology Pattern Shift Response Targets to Predict Electrical Properties
Ashby, Tom; Truffert, Vincent; Cerbu, Dorin; Ausschnitt, Kit; Charley, Anne-Laure; Verachtert, Wilfried; Wuyts, Roel (2024) -
Review-SEM image analysis with K-means algorithm
Halder, Sandip; Cerbu, Dorin; Saib, Mohamed; Leray, Philippe (2018) -
Thermal and quantum depletion of superconductivity in narrow junctions created by controlled electromigration
Baumans, Xavier; Cerbu, Dorin; Adami, O.-A.; Zharinov, V.; Verellen, Niels; Papari, G.; Moshchalkov, Victor; Silhanek, Alejandro; Van de Vondel, Joris (2015) -
Thermal and quantum depletion of superconductivity in narrow junctions created by controlled electromigration
Baumans, Xavier; Cerbu, Dorin; Adami, Obaid-Allah; Zharinov, Vyacheslav; Verellen, Niels; Papari, Gianpaolo; Scheerder, Jeroen; Zhang, Gufei; Moshchalkov, Victor; Silhanek, Alejandro; Van de Vondel, Joris (2016) -
Ultra-narrow superconducting junctions: electromigration to shed light on quantum point contacts
Baumans, Xavier; Cerbu, Dorin; Adami, Obaid-Allah; Zharinov, Vyacheslav; Verellen, Niels; Moshchalkov, Victor; Silhanek, Alejandro; Van de Vondel, Joris (2016) -
Understanding the significance of local variability in defect-aware process windows
Maslow, Mark John; Yaegashi, Hidetami; Frommhold, Andreas; Hara, Arisa; Cerbu, Dorin (2020) -
Unravelling stacking order in epitaxial bilayer MX2 using 4D-STEM
Nalin Mehta, Ankit; Gauquelin, Nicolas; Nord, Magnus; Orekhov, Andrey; Bender, Hugo; Cerbu, Dorin; Verbeeck, Johan; Vandervorst, Wilfried (2020) -
Unsupervised Machine Learning based CD-SEM image segregator for OPC and Process Window Estimation
Dey, Bappaditya; Cerbu, Dorin; Khalil, Kasem; Halder, Sandip; Leray, Philippe; Das, Sayantan; Sherazi, Yasser; Bayoumi, Magdy A.; Kim, Ryan Ryoung han (2020) -
Using machine learning algorithms on review sem images to understand stochastic behaviour of EUV based patterning for n7 and smaller nodes
Halder, Sandip; Cerbu, Dorin; Leray, Philippe (2018) -
Voltage contrast determination of design rules at the limits of EUV single patterning
Blanco, Victor; De Poortere, Etienne P.; Leray, Philippe; Cerbu, Dorin; van de Kerkhove, Jeroen; Kissoon, Nicola N. (2023)