Browsing by author "Maes, Herman"
Now showing items 1-20 of 294
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A 180nm secondary electron injection flash device
Xue, Gang; Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; Keppens, Bart; Maes, Herman (2001) -
A 1Mbit HIMOS® flash memory embedded in a 0.35μm CMOS process
Van Houdt, Jan; Tsouhlarakis, Jorgo; Hendrickx, Paul; Vanhorebeek, Guido; Wellekens, Dirk; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (2000) -
A 25ns/byte-programmable low-power SSI flash array with a new low-voltage erase scheme for embedded memory applications
Van Houdt, Jan; Haspeslagh, Luc; Wellekens, Dirk; Vanhorebeek, Guido; Groeseneken, Guido; Deferm, Ludo; Maes, Herman (1995) -
A 5 V-Compatible Flash EEPROM Cell with Microsecond Programming Time for Embedded Memory Applications
Van Houdt, Jan; Wellekens, Dirk; Faraone, Lorenzo; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1994) -
A CAD assisted design and optimisation methodology for over-voltage ESD protection circuits
Vassilev, Vesselin; Vaschenko, Vladislav; Jansen, Philippe; Choi, B.-J.; Concannon, An; Yang, J.-J,; Groeseneken, Guido; Mahadeva Iyer, Natarajan; Terbeek, Marcel; Hopper, Peter; Steyaert, Michiel; Maes, Herman (2004) -
A CMOS DC voltage doubler with nonoverlapping switching control
Kim, Shi-Ho; Tsouhlarakis, Jorgo; Van Houdt, Jan; Maes, Herman (2001) -
A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
Russ, Christian; Verhaege, Koen; Bock, Karlheinz; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
A compact MOSFET breakdown model for optimization of gate coupled ESD protection circuits
Vassilev, Vesselin; Groeseneken, Guido; Bock, Karlheinz; Maes, Herman (1999) -
A comparison of extraction techniques for threshold voltage mismatch
Croon, Jeroen; Tuinhout, Hans; Difrenza, R.; Knol, J.; Moonen, A.J.; Decoutere, Stefaan; Maes, Herman; Sansen, Willy (2002) -
A comprehensive study of boron and carbon diffusion models in SiGeC heterojunction bipolar transistors
Sibaja-Hernandez, Arturo; Decoutere, Stefaan; Maes, Herman (2005) -
A consistent model for the SANOS programming operation
Furnemont, Arnaud; Rosmeulen, Maarten; Cacciato, Antonio; Breuil, Laurent; De Meyer, Kristin; Maes, Herman; Van Houdt, Jan (2007) -
A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Depas, Michel; Maes, Herman (1995) -
A constant reference bit-line voltage data sensing technique without reference cell for 1T1C FeRAMs
Kim, S.; Kim, J.S.; You, I.K.; Lee, W.J.; Yu, B.G.; Maes, Herman (2002) -
A fast and simple methodology for lifetime prediction of ultra-thin oxides
Nigam, Tanya; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (1999) -
A ferroelectric capacitor model accounting for the switching kinetics and polarization relaxation
Bartic, Andrei; Kaczer, Ben; Wouters, Dirk; Maes, Herman (2001) -
A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Tsouhlarakis, Jorgo; Vanhorebeek, Guido; Verhoeven, Geert; De Blauwe, Jan; Kim, Shi-Ho; Wellekens, Dirk; Hendrickx, Paul; Haspeslagh, Luc; Van Houdt, Jan; Maes, Herman (2001) -
A low voltage, high performance 0.35 μm embedded flash EEPROM cell technology
Wellekens, Dirk; Van Houdt, Jan; De Blauwe, Jan; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (1998) -
A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures
Pinardi, Kuntjoro; Jain, Suresh; Willander, M.; Atkinson, A.; Maes, Herman; Van Overstraeten, Roger (1998) -
A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides
Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996)