Browsing by author "Bearda, Twan"
Now showing items 1-20 of 173
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1-μm-thin crystalline silicon solar cells with pseudo-ordered nanotextures
Depauw, Valerie; Massiot, Ines; Chen, Wanghua; Trompoukis, Christos; Bearda, Twan; Dmitriev, Alexandre; Roca i Cabarrocas, Pere; Gordon, Ivan; Poortmans, Jef (2016) -
11-Megapixel CMOS-integrated SiGe micromirror arrays for high-end applications
Witvrouw, Ann; Haspeslagh, Luc; Varela Pedreira, Olalla; De Coster, Jeroen; De Wolf, Ingrid; Tilmans, Harrie; Bearda, Twan; Schlatmann, Bart; van Bommel, Mark; de Nooijer, Christine; Magnee, P.H.C.; Lous, E.J.; Hagting, Marco; Lauria, John; Vanneer, Roel; van Drieenhuizen, Bert (2010) -
18% efficiency IBC cell with rear-surface processed on quartz
Dross, Frederic; O'Sullivan, Barry; Debucquoy, Maarten; Bearda, Twan; Govaerts, Jonathan; Labie, Riet; Loozen, Xavier; Granata, Stefano; El Daif, Ounsi; Trompoukis, Christos; Van Nieuwenhuysen, Kris; Meuris, Marc; Gordon, Ivan; Posthuma, Niels; Baert, Kris; Poortmans, Jef; Boulord, Caroline; Beaucarne, Guy (2013) -
2D periodic photonic nanostructures integrated in 40 $lm thin crystalline silicon solar cells
Trompoukis, Christos; El Daif, Ounsi; Depauw, Valerie; Bearda, Twan; Van Nieuwenhuysen, Kris; Govaerts, Jonathan; Sivaramakrishnan Radhakrishnan, Hariharsudan; Martini, Roberto; Granata, Stefano; Gordon, Ivan; Mertens, Robert; Poortmans, Jef (2014) -
A detailed study of semiconductor wafer drying
Fyen, Wim; Holsteyns, Frank; Bearda, Twan; Arnauts, Sophia; Van Steenbergen, Jan; Doumen, Geert; Kenis, Karine; Mertens, Paul (2004) -
A spectroscopic ellipsometry study of ultra thin amorphous silicon layers deposited on crystalline silicon by PECVD
Abdulraheem, Yaser; Gordon, Ivan; Bearda, Twan; Poortmans, Jef (2012) -
Acoustic cleaning in nano-electronics
Mertens, Paul; Janssens, Tom; Holsteyns, Frank; Zijlstra, Aaldert; Halder, Sandip; Wostyn, Kurt; Andreas, Michael; Hoyer, Ronald; Barbagini, Francesca; Wada, Masayuki; Franklin, Cole; Kim, Tae-Gon; Kim, K; Kenis, Karine; Le, Quoc Toan; Claes, Martine; Kesters, Els; Vos, Rita; Vereecke, Guy; Bearda, Twan; Heyns, Marc (2008) -
Advanced cleaning for the growth of ultrathin gate oxide
Mertens, Paul; Bearda, Twan; Houssa, Michel; Loewenstein, Lee; Cornelissen, Ingrid; De Gendt, Stefan; Kenis, Karine; Teerlinck, Ivo; Vos, Rita; Meuris, Marc; Heyns, Marc (1999) -
Advanced cleaning strategies for ultra-clean silicon surfaces
Heyns, Marc; Bearda, Twan; Cornelissen, Ingrid; De Gendt, Stefan; Loewenstein, Lee; Mertens, Paul; Mertens, Sofie; Meuris, Marc; Schaekers, Marc; Teerlinck, Ivo; Vos, Rita; Wolke, K. (1999) -
Advanced wafer surface cleaning technology
Mertens, Paul; Vos, Rita; Vereecke, Guy; Arnauts, Sophia; Bearda, Twan; De Waele, Rita; Eitoku, Atsuro; Fyen, Wim; Geckiere, J.; Hellin, David; Holsteyns, Frank; Kesters, Els; Claes, Martine; Kenis, Karine; Kraus, Harald; Malhouitre, Stephane; Lee, Kuntack; Kocsis, Michael; Onsia, Bart; Garaud, Sylvain; Rip, Jens; Snow, Jim; Teerlinck, I.; Van Hoeymissen, Jan; Barbagini, Francesca; Xu, Kaidong; Paraschiv, Vasile; De Gendt, Stefan; Mannaert, Geert; Heyns, Marc (2004) -
Advances in understanding wet cleaning technology and the effect of metal contamination
Heyns, Marc; Bearda, Twan; Cornelissen, Ingrid; De Gendt, Stefan; Loewenstein, Lee; Mertens, Paul; Mertens, S.; Meuris, Marc; Schaekers, Marc; Teerlinck, Ivo; Vos, Rita; Wolke, K. (1999) -
ALD Al2O3 for industrial Si solar cells: advanced cleaning and in-depth characterization
Vermang, Bart; Rothschild, Aude; Loozen, Xavier; Bearda, Twan; Cornagliotti, Emanuele; John, Joachim; Poortmans, Jef; Mertens, Robert (2010) -
All-dielectric antenna wavelength router with bidirectional scattering of visible light
Li, Jiaqi; Verellen, Niels; Vercruysse, Dries; Bearda, Twan; Lagae, Liesbet; Van Dorpe, Pol (2016) -
All-dielectric nano-antennas for wavelength-controlled bidirectional scattering of visible light
Li, Jiaqi; Verellen, Niels; Boeckx, Stef; Vercruysse, Dries; Willems, Kherim; Neutens, Pieter; Bearda, Twan; Chen, Chang; Lagae, Liesbet; Van Dorpe, Pol (2016) -
Approach for a standardized methodology for multisite processing of 300-mm wafers at R&D sites
Oechsner, Richard; Pfeffer, M.; Frickinger, J.; Schellenberger, M.; Roeder, G.; Pfitzner, L.; Ryssel, H.; Fritzsche, M.; Kaushik, V.; Renaud, D.; Danel, A.; Claeys, Cor; Bearda, Twan; Lering, M.; Graef, M.; Murphy, B.; Walther, H.; Hury, S. (2007) -
Atomic and electrical characterisation of amorphous silicon passivation layers
O'Sullivan, Barry; Thoan, N.H.; Jivanescu, M.; Pantisano, Luigi; Bearda, Twan; Dross, Frederic; Gordon, Ivan; Afanasiev, Valeri; Stesmans, Andre; Poortmans, Jef (2012) -
Behaviour of metallic contaminants during MOS processing
Bearda, Twan; De Gendt, Stefan; Loewenstein, Lee; Knotter, Martin; Mertens, Paul; Heyns, Marc (1998) -
Behaviour of metallic contaminants during MOS processing
Bearda, Twan; De Gendt, Stefan; Loewenstein, Lee; Knotter, Martin; Mertens, Paul; Heyns, Marc (1999) -
Breakdown and recovery of thin gate oxides
Bearda, Twan; Mertens, Paul; Heyns, Marc; Woerlee, P.; Wallinga, H. (2000) -
Breakdown and recovery of thin gate oxides
Bearda, Twan; Mertens, Paul; Heyns, Marc; Wallinga, H.; Woerlee, P. (2000)