Browsing by author "Modlinski, Robert"
Now showing items 1-14 of 14
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Creep as a reliability problem in MEMS
Modlinski, Robert; Witvrouw, Ann; Ratchev, Petar; Jourdain, Anne; Simons, Veerle; Tilmans, Harrie; den Toonder, Jaap M.J.; Puers, Bob; De Wolf, Ingrid (2004) -
Creep as a reliability problem in MEMS
Modlinski, Robert; Witvrouw, Ann; Ratchev, Petar; Puers, Bob; Toonder, J.M.J; De Wolf, Ingrid (2004) -
Creep characterization of Al alloy thin films for use in MEMS applications
Modlinski, Robert; Witvrouw, Ann; Ratchev, Petar; Puers, Robert; den Toonder, Jaap M.J.; De Wolf, Ingrid (2004) -
Creep in MEMS. Failures in MEMS due to creep, plasticity and processing-microstructures-temperatures related mechanisms
Modlinski, Robert (2011-01) -
Creep resistant aluminum alloys for use in MEMS
Modlinski, Robert; Witvrouw, Ann; Ratchev, Petar; Puers, Bob; De Wolf, Ingrid (2005) -
Failure mechanisms and reliability issues of RF-MEMS switches
De Wolf, Ingrid; Czarnecki, Piotr; Jourdain, Anne; Kalicinski, Stanislaw; Modlinski, Robert; Muller, Philippe; Rottenberg, Xavier; Soussan, Philippe; Tilmans, Harrie (2005) -
Failure mechanisms in MEMS/NEMS devices
van Spengen, Merlijn; Modlinski, Robert; Puers, Robert; Jourdain, Anne (2007-10) -
Generic RF-MEMS technology platform for mobile and satellite communications
Tilmans, Harrie; Rottenberg, Xavier; Soussan, Philippe; Nolmans, Philip; Ekkels, Phillip; Czarnecki, Piotr; Modlinski, Robert; Stoukatch, Serguei; Jourdain, Anne; Nauwelaers, Bart; Vaesen, Kristof; Carchon, Geert; De Wolf, Ingrid; De Raedt, Walter (2005) -
Mechanical characterisation of poly-SiGe layers for CMOS-MEMS integrated applications
Modlinski, Robert; Witvrouw, Ann; Verbist, Agnes; Puers, Bob; De Wolf, Ingrid (2010) -
Micro-tensile tests to characterize MEMS
Modlinski, Robert; Puers, Bob; De Wolf, Ingrid (2007) -
Reliability and failure analysis of RF MEMS switches
De Wolf, Ingrid; van Spengen, Merlijn; Modlinski, Robert; Jourdain, Anne; Witvrouw, Ann; Fiorini, Paolo; Tilmans, Harrie (2002) -
Reliability of RF-MEMS: stress relaxation in Al-alloy films
Modlinski, Robert; Chen, Q.; Witvrouw, Ann; Ratchev, Petar; Puers, Bob; den Toonder, J.M.J.; De Wolf, Ingrid (2003) -
Temperature induced microstructural changes and deformation of metal alloys used for RF-MEMS switches
Modlinski, Robert; Puers, Bob; De Wolf, Ingrid (2005-09) -
The influence of the package environment on the functioning and reliability of capacitive RF-MEMS switches
De Wolf, Ingrid; Czarnecki, Piotr; Jourdain, Anne; Modlinski, Robert; Tilmans, Harrie; Puers, Bob; van Beek, Joost; van Spengen, Merlijn (2005)