Browsing by author "Kwak, Dong Hwa"
Now showing items 1-7 of 7
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ALD deposition of high-k and metal gate stacks for advanced CMOS applications
Heyns, Marc; Beckx, Stephan; Caymax, Matty; Claes, Martine; De Gendt, Stefan; Degraeve, Robin; Delabie, Annelies; Deweerd, Wim; Groeseneken, Guido; Hooker, Jacob; Houssa, Michel; Kwak, Dong Hwa; Lander, Rob; Lujan, Guilherme; Maes, Jan; Niwa, Masaaki; Pantisano, Luigi; Puurunen, R.; Ragnarsson, Lars-Ake; Rohr, Erika; Schram, Tom; Van Elshocht, Sven; Vandervorst, Wilfried (2004) -
Correlation between stress-induced leakage current (SILC) and the HfO2 bulk trap density in a SiO2/HfO2 stack
Crupi, Felice; Degraeve, Robin; Kerber, Andreas; Kwak, Dong Hwa; Groeseneken, Guido (2004-04) -
High-k dielectrics integration prospects
Kubicek, Stefan; Van Elshocht, Sven; Delabie, Annelies; Yamamoto, Kazuhiko; Beckx, Stephan; Claes, Martine; Van Hoornick, Nausikaa; Kwak, Dong Hwa; Hyun, Sangjin; Rothschild, Aude; Veloso, Anabela; Kottantharayil, Anil; Lujan, Guilherme; Kittl, Jorge; Lauwers, Anne; Kaushik, Vidya; Niwa, Masaaki; De Gendt, Stefan; Heyns, Marc; Jurczak, Gosia; Biesemans, Serge (2005) -
Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime
Cimino, Salvatore; Pantisano, Luigi; Aoulaiche, Marc; Degraeve, Robin; Kwak, Dong Hwa; Crupi, Felice; Groeseneken, Guido; Paccagnella, A. (2005) -
On the defect generation and low voltage extrapolation of QBD in SiO2/HfO2 stacks
Degraeve, Robin; Crupi, F.; Kwak, Dong Hwa; Groeseneken, Guido (2004) -
Reliability issues in high-k stacks
Degraeve, Robin; Crupi, Felice; Houssa, Michel; Kwak, Dong Hwa; Kerber, Andreas; Cartier, Eduard; Kauerauf, Thomas; Roussel, Philippe; Autran, Jean-Luc; Pourtois, Geoffrey; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc; Groeseneken, Guido (2004-09) -
Scaling of Hf-based high-k dielectrics
Heyns, Marc; Beckx, Stephan; Caymax, Matty; Chen, J.; Claes, Martine; Coenegrachts, Bart; De Gendt, Stefan; Degraeve, R.; Delabie, Annelies; Deweerd, Wim; Groeseneken, Guido; Hayashi, Shigenori; Henson, Kirklen; Hooker, Jacob; Houssa, Michel; Kauerauf, Thomas; Kerber, A.; Kwak, Dong Hwa; Lander, Rob; Lujan, Guilherme; Niwa, Masaaki; Pantisano, Luigi; Puurunen, Riikka; Ragnarsson, Lars-Ake; Rohr, Erika; Schram, Tom; Shimamoto, Y.; Tsai, Wilman; Van Elshocht, Sven; Vertommen, Johan; Vandervorst, Wilfried; Kubicek, Stefan (2004)