Browsing by author "Kobayashi, Daisuke"
Now showing items 1-10 of 10
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Analog performance of 60 MeV proton-irradiated SOI MuGFETs with different strain technologies
Agopian, P.G.D.; Martino, J.A.; Kobayashi, Daisuke; Poizat, M.; Simoen, Eddy; Claeys, Cor (2011) -
Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers
Kobayashi, Daisuke; Bargallo Gonzalez, Mireia; Rosseel, Erik; Hikavyy, Andriy; Hirose, K.; Simoen, Eddy; Claeys, Cor (2010) -
Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers
Kobayashi, Daisuke; Bargallo Gonzalez, Mireia; Rosseel, Erik; Hikavyy, Andriy; Hirose, Kazuyuki; Simoen, Eddy; Claeys, Cor (2010-10) -
Growth and processing defects in CMOS homo- and hetero-epitaxy
Simoen, Eddy; Bargallo Gonzalez, Mireia; Eneman, Geert; Rosseel, Erik; Hikavyy, Andriy; Kobayashi, Daisuke; Loo, Roger; Caymax, Matty; Claeys, Cor (2011) -
High doping density/high electric field, stress and heterojunction effects on the characteristisc of CMOS compatible p-n junctions
Simoen, Eddy; Eneman, Geert; Bargallo Gonzalez, Mireia; Kobayashi, Daisuke; Luque Rodriguez, Abraham; Jimenez Tejada, J.-A.; Claeys, Cor (2011) -
High doping/high electric field effects on the characteristics of CMOS compatible p-n junctions
Simoen, Eddy; Eneman, Geert; Bargallo Gonzalez, Mireia; Kobayashi, Daisuke; Luque Rodriguez, Abraham; Jimenez Tejada, Juan-Antonio; Claeys, Cor (2010) -
Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions
Luque Rodriguez, Abraham; Bargallo Gonzalez, Mireia; Eneman, Geert; Claeys, Cor; Kobayashi, Daisuke; Simoen, Eddy; Jiménez Tejada, Juan A. (2011) -
Impact of process variability on the radiation-induced soft error rate of decananometer SRAMs in hold and read conditions
Griffoni, Alessio; Zuber, Paul; Dobrovolny, Petr; Roussel, Philippe; Linten, Dimitri; Alles, Michael L.; Schrimpf, Ronald D.; Reed, Robert A.; Kobayashi, Daisuke; Simoen, Eddy; Groeseneken, Guido (2011) -
Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates
Kobayashi, Daisuke; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; Hirose, Kazuyuki; Claeys, Cor (2011) -
Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates
Kobayashi, Daisuke; Simoen, Eddy; Put, Sofie; Griffoni, Alessio; Poizat, Marc; Hirose, Kazuyuki; Claeys, Cor (2010)