Browsing by author "Hoofman, Romano"
Now showing items 1-12 of 12
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A feasibility study of dual damascene porous SiLK resin with spin-on hard masks
Hoofman, Romano; Michelon, Julien; Verheijden, G.J.A.M.; Waeterloos, Joost; Caluwaerts, Rudy; Schmidt, M.O.; Demeurisse, Caroline; Vandeweyer, Tom; Demuynck, Steven; Tokei, Zsolt; Beyer, Gerald (2004) -
Air-gap formation by UV-assisted decomposition of CVD material
Pantouvaki, Marianna; Humbert, Aurelie; Van Besien, Els; Camerotto, Elisabeth; Travaly, Youssef; Richard, Olivier; Willegems, Myriam; Volders, Henny; Kellens, Kristof; Daamen, Roel; Hoofman, Romano; Beyer, Gerald (2008) -
Air-gap formation by UV-assisted decomposition of CVD material
Pantouvaki, Marianna; Humbert, Aurelie; Van Besien, Els; Camerotto, Elisabeth; Travaly, Youssef; Richard, Olivier; Willegems, Myriam; Volders, Henny; Kellens, Kristof; Daamen, Roel; Hoofman, Romano; Beyer, Gerald (2008) -
Challenges in the implentation of low-k dielectrics in the back-end of line
Hoofman, Romano; Brom - Verheyden, Greja; Michelon, Julien; Iacopi, Francesca; Travaly, Youssef; Baklanov, Mikhaïl; Tokei, Zsolt; Beyer, Gerald (2005) -
Comparison of n- and p-type high efficiency silicon solar cell performance under low illumination conditions
Gong, Chun; Posthuma, Niels; Dross, Frederic; Van Kerschaver, Emmanuel; Flamand, Giovanni; Beaucarne, Guy; Poortmans, Jef; Hoofman, Romano (2008) -
Electromigration study of sub-100nm Cu-lines
Michelon, Julien; Bruynseraede, Christophe; Tio Castro, David; Roussel, Philippe; Hoofman, Romano; Maex, Karen (2005) -
Impact of the barrier/dielectric interface quality on reliability of Cu porous-low-k interconnects
Tokei, Zsolt; Sutcliffe, Victor; Demuynck, Steven; Iacopi, Francesca; Roussel, Philippe; Beyer, Gerald; Hoofman, Romano; Maex, Karen (2004) -
Integrated bio-photonics to revolutionize health care enabled through PIX4life and PIXAPP
Jans, Hilde; O'Brien, Peter; Artundo, Inigo; Porcel, Marco A.G.; Hoofman, Romano; Geuzebroek, Douwe; Dumon, Pieter; van der Vliet, Marcel; Witzens, Jeremy; Bourguignon, Eric; Van Dorpe, Pol; Lagae, Liesbet (2018) -
Integration of low-k dielectric films in damascene processes
Hoofman, Romano; Nguyen Hoang, Viet; Arnal, V.; Broekaart, M.; Gosset, L.G.; Besling, W.F.A.; Fayolle, M.; Iacopi, Francesca (2007) -
Post patterning meso porosity creation: a potential solution for pore sealing
Caluwaerts, Rudy; Van Hove, Marleen; Beyer, Gerald; Hoofman, Romano; Struyf, Herbert; Brom - Verheyden, Greja; Waeterloos, Joost; Tokei, Zsolt; Iacopi, Francesca; Carbonell, Laure; Le, Quoc Toan; Das, Arabinda; Vos, Ingrid; Demuynck, Steven; Maex, Karen (2003) -
Scale Up Of Advanced Packaging And System Integration For Hybrid Technologies
Selim, Ramsey; Hoofman, Romano; Labie, Riet; Sandeep, Veda; Drischel, Thomas; Torki, Kholdoun (2021-07-02) -
Void growth modeling upon electromigration stressing in single damascene cu lines
Tio Castro, David; Hoofman, Romano; Michelon, Julien; Bruynseraede, Christophe (2007)