Browsing by author "Vasina, Petr"
Now showing items 1-18 of 18
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1/f noise and DLTS of LEDs
Chobola, Z.; Vasina, Petr; Sikula, J.; Jurankova, V.; Claeys, Cor; Simoen, Eddy (1996) -
A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Vasina, Petr; Sikula, J.; Simoen, Eddy; Claeys, C. (1995) -
A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Vasina, Petr; Simoen, Eddy; Claeys, Cor; Sikula, J. (1998) -
A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
Vasina, Petr; Simoen, Eddy; Sikula, J.; Claeys, Cor (1996) -
Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's
Simoen, Eddy; Vasina, Petr; Sikula, J.; Claeys, Cor (1997) -
GRT model for random telegraph signals in MOSFETs
Sikula, J.; Vasina, Petr; Kolarova, Renata; Pavelka, J.; Claeys, C.; Simoen, Eddy; Brini, J.; Kamarinos, G. (1999) -
High frequency RTS noise in submicron MOSFETs
Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy; Matulionis, A.; Stadalnikas, A.; Palenskis, V. (1996) -
Low frequency noise assessment of hot carrier stress effects in 0.7µm MOSFETs
Vasina, Petr; Simoen, Eddy; Claeys, Cor; Sikula, J. (1995) -
Low-frequency 1/f noise behaviour of deep submicron n-MOSFETS
Simoen, Eddy; Biesemans, Serge; Claeys, Cor; De Meyer, Kristin; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Kolarova, Renata; Vasina, Petr; Sikula, J. (1999) -
Low-frequency noise behaviour of high-energy electron irradiated Si n+p junction diodes
Dubuc, Jean-Paul; Simoen, Eddy; Vasina, Petr; Claeys, C. (1995) -
Models for Burst and RTS Noise Mechanism in Electronic Devices
Sikula, J.; Sikulova, M.; Vasina, Petr; Claeys, C.; Simoen, Eddy (1995) -
Noise and THI reliability indicators for thin film resistors
Sikula, J.; Hruska, P.; Vasina, Petr; Schauer, P.; Kolarova, R.; Hajek, K.; Stadalnikas, A.; Palenskis, V.; Claeys, Cor; Simoen, Eddy (1996) -
RTS noise and its independence on longitudinal and transverse electrical field
Vasina, Petr; Sikula, J.; Claeys, Cor; Simoen, Eddy (1997) -
RTS noise in submicron MOSFETs
Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, C.; Simoen, Eddy; Stadalnikas, A. (1996) -
Status of NODITO project
Sikula, J.; Vasina, Petr; Claeys, Cor (1995) -
Stochastic model for the RTS noise in submicron MOSFETs
Sikula, J.; Sikulova, M.; Vasina, Petr; Claeys, Cor; Simoen, Eddy; De Keersgieter, An (1995) -
Transition intensities and noise spectra in submicron MOSFETs
Härtler, G.; Golze, U.; Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy (1997) -
Transition probabilities and noise spectra in submicron MOSFETs
Haertler, C.; Golze, U.; Sikula, J.; Sikulova, M.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy (1996)