Browsing by author "Martino, J.A."
Now showing items 1-20 of 134
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A study on the self-heating effect in deep submicrometer partially depleted SOI MOSFET at low temperature
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor; De Meyer, Kristin (2003) -
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices
Trevisoli, R.D.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2012) -
An analytical model for the non-linearity of triple gate SOI MOSFETs
Doria, R.T.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2011) -
Analog application of SOI nFinFETs with different TiN gate electrode thickness operating at cryogenic temperatures
Rodrigues, M.; Galeti, M.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2010) -
Analog operation of uniaxially and biaxially strained FD SOI nMOSFETs at cryogenic temperatures
de Souza, M.; Martino, J.A.; Simoen, Eddy; Claeys, Cor; Pavanello, M.A. (2008) -
Analog operation of uniaxially strained FD SOI nMOSFETs in cryogenic temperatures
de Souza, M.; Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2007) -
Analog parameters of MuGFET devices with different source/drain engineering
Galeti, M.; Rodrigues, M.; Martino, J.A.; Collaert, Nadine; Simoen, Eddy; Aoulaiche, Marc; Claeys, Cor (2012) -
Analog performance at room and low temperature of triple-gate devices: Bulk, DTMOS, BOI and SOI
Andrade, M.G.C.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2012) -
Analog performance of 60 MeV proton-irradiated SOI MuGFETs with different strain technologies
Agopian, P.G.D.; Martino, J.A.; Kobayashi, Daisuke; Poizat, M.; Simoen, Eddy; Claeys, Cor (2011) -
Analog performance of SOI FinFETs with different TiN gate electrode thickness
Galeti, M.; Rodrigues, M.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2010) -
Analog performance of SOI MOSFETs with different TiN gate electrode thickness and hHigh-k dielectrics
Galeti, M.; Rodrigues, M.; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2011) -
Analog performance of standard and strained triple-gate nFINFETS
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Rooyackers, Rita; Collaert, Nadine; Claeys, Cor (2008) -
Analysis of deep submicron bulk and fully depleted SOI nMOSFET analog operation at cryogenic temperatures
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2005) -
Analysis of standard and strained FinFET operation in source-follower buffer configuration
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Rooyackers, Rita; Collaert, Nadine; Claeys, Cor (2009) -
Analysis of temperature-induced saturation threshold voltage degradation in deep-submicron ultrathin SOI MOSFETs
Pavanello, M.A.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2005) -
Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
Rodrigues, Michele; Cho, Moon Ju; Martino, J.A.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009-09) -
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Agopian, G.P.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2005) -
Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
Itocazu, V.T.; Sonnenberg, V.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012) -
Analysis of the total resistance in standard and strained FinFET devices with and without the u se of SEG
Nicoletti, T.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2009) -
Analysis of the transistor efficiency of gas phase Zn diffusion In0.53Ga0.47As nTFETs at different temperatures
Bordallo, Caio; Martino, J.A.; Agopian, P.G.D.; Alian, AliReza; Mols, Yves; Rooyackers, Rita; Vandooren, Anne; Verhulst, Anne; Simoen, Eddy; Claeys, Cor; Collaert, Nadine (2017)