Browsing by author "Kulisch, W."
Now showing items 1-6 of 6
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Characterization of conductive probes for atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried; Hellemans, L.; Kulisch, W.; Oesterschulze, E.; Niedermann, P.; Sulzbach, T. (1999) -
Diamond tips and cantilevers for the characterization of semiconductor devices
Malavé, A.; Oesterschulze, E.; Kulisch, W.; Trenkler, Thomas; Hantschel, Thomas; Vandervorst, Wilfried (1999) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Hellemans, L.; Vandervorst, Wilfried; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (1999) -
Evaluating probes for "electrical" atomic force microscopy
Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L.; Malavé, A.; Büchel, D.; Oesterschulze, E.; Kulisch, W.; Niedermann, P.; Sulzbach, T.; Ohlsson, O. (2000) -
Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Hantschel, Thomas; Trenkler, Thomas; Vandervorst, Wilfried; Malave, A.; Kulisch, W.; Oesterschulze, E.; Buechel, D. (1998) -
Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Hantschel, Thomas; Trenkler, Thomas; Vandervorst, Wilfried; Malavé, A.; Büchel, D.; Kulisch, W.; Oesterschulze, E. (1999)