Browsing by author "Doumen, Geert"
Now showing items 1-20 of 47
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A detailed study of semiconductor wafer drying
Fyen, Wim; Holsteyns, Frank; Bearda, Twan; Arnauts, Sophia; Van Steenbergen, Jan; Doumen, Geert; Kenis, Karine; Mertens, Paul (2004) -
A force study in brush scrubbing
Xu, Kaidong; Vos, Rita; Vereecke, Guy; Doumen, Geert; Fyen, Wim; Mertens, Paul; Heyns, Marc; Vinckier, Chris; Fransaer, Jan (2005) -
A force study in brush scrubbing
Xu, Kaidong; Vos, Rita; Vereecke, Guy; Doumen, Geert; Mertens, Paul; Heyns, Marc (2004) -
A high-performance drying method enabling clustered single wafer wet cleaning
Mertens, Paul; Doumen, Geert; Lauerhaas, Jeff; Kenis, Karine; Fyen, Wim; Meuris, Marc; Arnauts, Sophia; Devriendt, Katia; Vos, Rita; Heyns, Marc (2000) -
Advancing c-Si PV research from module manufacturing through to system simulation: The buildup of Imec capabilities in EnergyVille
Govaerts, Jonathan; Goverde, Hans; Borgers, Tom; van der Heide, Arvid; Horvath, Imre T; Manganiello, Patrizio; Tsanakas, Ioannis; Van Dyck, Rik; Chowdhury, Gofran; El Chami, Ibrahim; Bakovasilis, Apostolos; Voroshazi, Eszter; Nivelle, Philippe; Carolus, Jorne; Daenen, Michaël; Vastmans, Luc; Moors, Reinoud; Doumen, Geert; Flamand, Giovanni; Pieters, Philip; Szlufcik, Jozef; Poortmans, Jef (2019) -
An ATR-FTIR based method for dynamic analysis of wetting transitions on superhydrophobic nanostructured surfaces
Vrancken, Nandi; Sergeant, Stefanie; Vereecke, Guy; Doumen, Geert; Holsteyns, Frank; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2017) -
Cleaning of nanoparticles in semiconductor manufacturing
Vereecke, Guy; Arnauts, Sophia; Doumen, Geert; Eitoku, Atsuro; Fransaer, J.; Fyen, Wim; Holsteyns, Frank; Kenis, Karine; Lee, Kuntack; Lux, Marcel; Snow, Jim; Vinckier, Chris; Vos, Rita; Xu, Kaidong; Mertens, Paul (2004) -
Cu plating of through-Si vias for 3D-stacked integrated circuits
Radisic, Alex; Luhn, Ole; Swinnen, Bart; Bender, Hugo; Drijbooms, Chris; Doumen, Geert; Kellens, Kristof; Ruythooren, Wouter; Vereecken, Philippe (2008) -
Cu Plating of Through-Si Vias for 3D-Stacked Integrated Circuits
Radisic, Alex; Luhn, Ole; Swinnen, Bart; Bender, Hugo; Drijbooms, Chris; Doumen, Geert; Kellens, Kristof; Ruythooren, Wouter; Vereecken, Philippe (2009) -
Developments in cleaning technology for critical layers
Heyns, Marc; Arnauts, Sophia; Bearda, Twan; Claes, M.; Cornelissen, Ingrid; De Gendt, Stefan; Doumen, Geert; Fyen, Wim; Loewenstein, Lee; Lux, Marcel; Mertens, Paul; Mertens, S.; Meuris, Marc; Onsia, Bart; Röhr, Erika; Schaekers, Marc; Teerlinck, Ivo; Van Doorne, Patrick; Van Hoeymissen, Jan; Vereecke, Guy; Vos, Rita; Wolke, K. (2000) -
Electrochemical and analytical study of the Si etching mechanism in HF
Valckx, Nick; Vos, Rita; Rip, Jens; Doumen, Geert; Mertens, Paul; Bearda, Twan; Heyns, Marc; De Gendt, Stefan (2009) -
Electrochemical and analytical study of the Si etching mechanism in HF
Valckx, Nick; Vos, Rita; Rip, Jens; Doumen, Geert; Mertens, Paul; Bearda, Twan; Heyns, Marc; De Gendt, Stefan (2009) -
Encapsulant-integrated interconnection of bifacial solar cells for BIPV applications: Latest results in the TWILL-BIPV project
Govaerts, Jonathan; Borgers, Tom; Van Dyck, Rik; Andries, Nick; Meyers, Pieter; van der Heide, Arvid; Vastmans, Luc; Moors, Reinoud; Doumen, Geert; Nivelle, Philippe; Daenen, Michaël; Voroshazi, Eszter; Arnett, Chad; Labie, Riet; Van den Storme, Manuel; Van den Storme, Guy; Dekens, Marc; Vandebroek, Steven; Schroyen, Peter; Smeers, Kris; Vavilkin, Tatjana; Dewallef, Stefan; Abgrall, Florent; Jousset, Dominique; Poortmans, Jef (2020-10) -
Evaluation of high-speed linear air-knife based wafer dryer
Tamaddon, Amir-Hossein; Belmiloud, Naser; Doumen, Geert; Struyf, Herbert; Mertens, Paul; Heyns, Marc (2012) -
Evaluation of high-speed linear air-knife based wafer dryer
Tamaddon, Amir-Hossein; Belmiloud, Naser; Doumen, Geert; Struyf, Herbert; Mertens, Paul; Heyns, Marc (2013) -
Fundamental study of the removal mechanisms of nano-sized particles using brush scrubber cleaning
Xu, Kaidong; Vos, Rita; Vereecke, Guy; Doumen, Geert; Fyen, Wim; Mertens, Paul; Heyns, Marc; Vinckier, Chris; Fransaer, J.; Kovacs, F. (2005) -
Impact of acoustical reflections on megasonic cleaning performance
Brems, Steven; Hauptmann, Marc; Camerotto, Elisabeth; Pacco, Antoine; Halder, Sandip; Zijlstra, Aaldert; Doumen, Geert; Bearda, Twan; Mertens, Paul (2009) -
Impact of acoustical reflections on megasonic cleaning performance
Brems, Steven; Hauptmann, Marc; Camerotto, Elisabeth; Pacco, Antoine; Halder, Sandip; Zijlstra, Aaldert; Doumen, Geert; Bearda, Twan; Mertens, Paul (2009) -
In-situ ATR-FTIR characterization of wetting transitions on superhydrophobic nanostructured surfaces
Vrancken, Nandi; Sergeant, Stefanie; Vereecke, Guy; Doumen, Geert; Holsteyns, Frank; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2017) -
In-situ ATR-FTIR for dynamic analysis of superhydrophobic breakdown on nanostructured silicon surfaces
Vrancken, Nandi; Li, Jiaqi; Sergeant, Stefanie; Vereecke, Guy; Doumen, Geert; Holsteyns, Frank; Chen, Chang; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2018)