Browsing by author "Rogge, S."
Now showing items 1-13 of 13
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Atomistic understanding of a single gated dopant atom in a MOSFET
Lansbergen, G.; Rahman, R.; Wellard, C.; Caro, J.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.; Rogge, S. (2008) -
Coherent transport through a double donor system in silicon
Verduijn, J.; Tettamanzi, G.; Lansbergen, G.P.; Collaert, Nadine; Biesemans, Serge; Rogge, S. (2010) -
Direct observation by resonant tunneling of the B+ level in a delta-doped silicon barrier
Caro, J.; Vink, I.D.; Smit, G.D.J.; Rogge, S.; Klapwijk, T.M.; Loo, Roger; Caymax, Matty (2004) -
Electric field reduced charging energies and two-electron bound excited states of single donors in silicon
Rahman, R.; Lansbergen, G.; Verduijn, J.; Tettamanzi, G.C.; Park, S.H.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2011) -
Electron transport properties of single donors in nanoscale Si MOSFETs
Verduijn, J.; Lansbergen, G.; Tettamanzi, G.C.; Rahman, R.; Biesemans, Serge; Collaert, Nadine; Klimeck, G.; Hollenberg, L.; Rogge, S. (2009) -
From single-atom spectroscopy to lifetime enhanced triplet transport in MOSFETs
Verduijn, J.; Lansbergen, G.P.; Tettamanzi, G.C.; Rahman, R.; Biesemans, Serge; Collaert, Nadine; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2009) -
Gate-induced quantum- confinement transition of a single dopant atom in a silicon FinFET
Lansbergen, G.P.; Rahman, R.; Wellard, C.J.; Woo, I.; Caro, J.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2008) -
Innovative characterization techniques for ultra-scaled FinFETs
Tettamanzi, G.C.; Lansbergen, G.P.; Verduijn, J.; Rahman, R.; Paul, A.; Lee, S.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Rogge, S. (2010) -
Lifetime-enhanced transport in silicon due to spin and valley blockade
Lansbergen, G.P.; Rahman, R.; Verduijn, J.; Tettamanzi, G.C.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2011) -
Probing the spin states of a single acceptor atom
van der Heijden, J.; Salfi, J.; Mol, J.A.; Verduijn, J.; Tettamanzi, G.C.; Hamilton, A. R.; Collaert, Nadine; Rogge, S. (2014) -
Single-electron capacitance spectroscopy of individual dopants in silicon
Gasseller, M.; DeNinno, M.; Loo, Roger; Harrison, J.F; Caymax, Matty; Rogge, S.; Tessmer, S.H. (2011-10) -
Towards Tunneling Through a Single Dopant Atom
Caro, J.; Smit, G.D.J.; Sellier, H.; Loo, Roger; Caymax, Matty; Rogge, S.; Klapwijk, T.M. (2005) -
Transport-based dopant metrology in advanced FinFETs
Lansbergen, G.P.; Rahman, R.; Wellard, C.J.; Caro, J.; Collaert, Nadine; Biesemans, Serge; Klimeck, G.; Hollenberg, L.C.L.; Rogge, S. (2008)