Browsing by author "De Witte, Hilde"
Now showing items 41-49 of 49
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Synthesizing a secondary ionization model for matrix elements sputtered from SiOx: findings and trends
Serrano, Javier; De Witte, Hilde; Guzman, B.; Blanco, J. M.; Vandervorst, Wilfried (2000) -
The origins of fluorine in dry ultrathin silicon oxides
Vereecke, Guy; Röhr, Erika; Carter, Richard; Conard, Thierry; De Witte, Hilde; Heyns, Marc (2001) -
TOF-SIMS artifact in the analysis of ZrO2/SiO2/Si stacks
De Witte, Hilde; Conard, Thierry; Vandervorst, Wilfried; Gijbels, Renaat (2001) -
Ultra-shallow junction profiling
Vandervorst, Wilfried; Clarysse, Trudo; Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Xu, Mingwei; Janssens, Tom; De Witte, Hilde; Conard, Thierry; Deleu, Jeroen; Badenes, Gonçal (2000) -
(Un)solvable problems in SIMS
Vandervorst, Wilfried; Janssens, Tom; De Witte, Hilde; Conard, Thierry; Lindsay, Richard; Fruehauf, Jens; Loo, Roger; Caymax, Matty (2001) -
X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface
Conard, Thierry; Kondoh, Eiichi; De Witte, Hilde; Maex, Karen; Vandervorst, Wilfried (1999) -
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers
Conard, Thierry; De Witte, Hilde; Loo, Roger; Verheyden, P.; Vandervorst, Wilfried; Caymax, Matty; Gijbels, Renaat (1999) -
XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers
Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Caymax, Matty; Loo, Roger; Verheyen, P.; Gijbels, Renaat (1998) -
XPS study of ion induced oxidation of silicon with and without oxygen flooding
De Witte, Hilde; Conard, Thierry; Sporken, R.; Gouttebaron, R.; Magnée, R.; Vandervorst, Wilfried; Caudano, R.; Gijbels, Renaat (2000)