Browsing by author "Wouters, Lennaert"
Now showing items 1-18 of 18
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3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors
Eyben, Pierre; Ritzenthaler, Romain; De Keersgieter, An; Chiarella, Thomas; Veloso, Anabela; Mertens, Hans; Pena, Vanessa; Santoro, Gaetano; Machillot, Jerome; Kim, Myungsun; Miyashita, Toshihiko; Yoshida, Naomi; Bender, Hugo; Richard, Olivier; Celano, Umberto; Paredis, Kristof; Wouters, Lennaert; Mitard, Jerome; Horiguchi, Naoto (2019) -
Advanced Current-Voltage Model of Electrical Contacts to GaAs- and Ge-Based Active Silicon Photonic Devices
Hsieh, Ping-Yi; O'Sullivan, Barry; Tsiara, Artemisia; Truijen, Brecht; Lagrain, Pieter; Wouters, Lennaert; Yudistira, Didit; Kunert, Bernardette; Van Campenhout, Joris; De Wolf, Ingrid (2023) -
Apparent size effects on dopant activation in nanometer-wide Si fins
Folkersma, Steven; Bogdanowicz, Janusz; Favia, Paola; Wouters, Lennaert; Petersen, Dirch Hjorth; Hansen, Ole; Henrichsen, Henrik Hartmann; Nielsen, Peter Former; Shiv, Lior; Vandervorst, Wilfried (2021) -
Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
Minj, Albert; Zhao, Ming; Bakeroot, Benoit; Paredis, Kristof; Wouters, Lennaert; Hantschel, Thomas; Decoutere, Stefaan (2021) -
Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Wouters, Lennaert; Minj, Albert; Celano, Umberto; Hantschel, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2020) -
Combining TCAD and advanced metrology techniques to support device integration towards N3
Eyben, Pierre; De Keersgieter, An; Celano, Umberto; Wouters, Lennaert; Chiarella, Thomas; Ritzenthaler, Romain; Mertens, Hans; Richard, Olivier; Paredis, Kristof; Matagne, Philippe; Mitard, Jerome; Horiguchi, Naoto; Goux, Ludovic (2021) -
Electrical properties of extended defects in strain relaxed GeSn
Gupta, Somya; Simoen, Eddy; Loo, Roger; Shimura, Yosuke; Gencarelli, Federica; Wouters, Lennaert; Paredis, Kristof; Bender, Hugo; Vrielink, Henk; Heyns, Marc (2018) -
Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices
Wan, Danny; Manfrini, Mauricio; Vaysset, Adrien; Souriau, Laurent; Wouters, Lennaert; Thiam, Arame; Raymenants, Eline; Sayan, Safak; Jussot, Julien; Swerts, Johan; Couet, Sebastien; Rassoul, Nouredine; Babaei Gavan, Khashayar; Paredis, Kristof; Huyghebaert, Cedric; Ercken, Monique; Wilson, Chris; Mocuta, Dan; Radu, Iuliana (2018) -
Hedgehog probe tips enabling high-resolution scanning probe microscopy
Boehme, Thijs; Hantschel, Thomas; Wouters, Lennaert; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried (2019) -
Integration of interconnected magnetic tunnel junctions for spin torque majority gates
Wan, Danny; Manfrini, Mauricio; Souriau, Laurent; Sayan, Safak; Jussot, Julien; Swerts, Johan; Rassoul, Nouredine; Babaei Gavan, Khashayar; Wouters, Lennaert; Paredis, Kristof; Huyghebaert, Cedric; Vaysset, Adrien; Thiam, Arame; Ercken, Monique; Wilson, Chris; Mocuta, Dan; Radu, Iuliana (2017) -
Local Enhancement of Dopant Diffusion from Polycrystalline Silicon Passivating Contacts
Firat, Meric; Wouters, Lennaert; Lagrain, Pieter; Haase, Felix; Polzin, Jana-Isabelle; Chaudhary, Aditya; Nogay, Gizem; Desrues, Thibaut; Krugener, Jan; Peibst, Robby; Tous, Loic; Sivaramakrishnan Radhakrishnan, Hariharsudan; Poortmans, Jef (2022) -
Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Schulze, Andreas; Eyben, Pierre; Mody, Jay; Paredis, Kristof; Wouters, Lennaert; Celano, Umberto; Vandervorst, Wilfried (2019) -
Mechanisms of high-pressure tip-induced material removal toward a tomographic AFM
Celano, Umberto; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; van der Heide, Paul; Vandervorst, Wilfried (2018) -
Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications
Noel, Celine; Wouters, Lennaert; Paredis, Kristof; Celano, Umberto; Hantschel, Thomas (2021-12) -
Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
Celano, Umberto; Hantschel, Thomas; Boehme, Thijs; Kanniainen, A.; Wouters, Lennaert; Bender, Hugo; Bosman, Niels; Drijbooms, Chris; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Self-patterned ultra-sharp diamond tips and their application for advanced nanoelectronics device characterization by electrical SPM
Wouters, Lennaert; Boehme, Thijs; Mana, Luca; Hantschel, Thomas (2023) -
Understanding the kinetics of Metal Induced Lateral Crystallization process to enhance the poly-Si channel quality and current conduction in 3-D NAND memory
Ramesh, Siva; Vadakupudhu Palayam, Senthil; Ajaykumar, Arjun; Opsomer, Karl; Bastos, Joao; Ragnarsson, Lars-Ake; Breuil, Laurent; Arreghini, Antonio; Wouters, Lennaert; Spampinato, Valentina; Favia, Paola; Nalin Mehta, Ankit; Carolan, Patrick; Nyns, Laura; Katcko, Kostantine; Stiers, Jimmy; Van den Bosch, Geert; Rosmeulen, Maarten (2021) -
Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
Celano, Umberto; Xiaoli, Hu; Pandey, Komal; Wouters, Lennaert; Paredis, Kristof; Hantschel, Thomas; van der Heide, Paul; Martini, Ashlie (2019)