Browsing by author "Schoenmaker, Wim"
Now showing items 21-40 of 91
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Early resistance change modelling in electromigration
Mouthaan, T.; Petrescu, Violeta; Schoenmaker, Wim; Groot, F.; Angelecu, S.; Niehof, J.; Profirescu, M. D. (1995) -
Electromagnetic interconnects and passives modeling: software implementation issues
Schoenmaker, Wim; Meuris, Peter (2002) -
Energy and momentum balance equations: an approach to quantum transport in closed circuits
Soree, Bart; Magnus, Wim; Schoenmaker, Wim (2002) -
Energy dissipation in mesoscopic circuits
Soree, Bart; Magnus, Wim; Schoenmaker, Wim (2003-09) -
Energy dissipation in mesoscopic circuits
Soree, Bart; Magnus, Wim; Schoenmaker, Wim (2003) -
FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Mieville, Jean-Paul; Van den Bosch, Geert; Deferm, Ludo; Bellens, Rudi; Groeseneken, Guido; Maes, Herman; Schoenmaker, Wim (1994) -
Full quantum mechanical model for the charge distribution and the leakage currents in ultra-thin metal-insulator-semiconductor capacitors
Magnus, Wim; Schoenmaker, Wim (2000) -
Full quantummechanical treatment of charge leakage in MOS capacitors with ultra-thin oxide layers
Magnus, Wim; Schoenmaker, Wim (1999) -
Ghost fields in classical gauge theories
Schoenmaker, Wim; Magnus, Wim; Meuris, Peter (2002) -
Impact of charging on breakdown in deep trench isolation structures
Elattari, Brahim; Van den Bosch, Geert; Schoenmaker, Wim; Groeseneken, Guido; Coppens, P.; Moens, P.; De Pestel, F. (2003) -
Inductance calculations based on lattice-gauge electromagnetic modeling
Meuris, Peter; Schoenmaker, Wim; Magnus, Wim (2001) -
Introduction to electromagnetism
Magnus, Wim; Schoenmaker, Wim (2005-04) -
Lattice-gauge theoretical modeling of back-end structures
Meuris, Peter; Schoenmaker, Wim; Magnus, Wim (2001) -
Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim; Decoutere, Stefaan; Loo, Roger; Caymax, Matty; Vandervorst, Wilfried (2001) -
Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers with a linearly graded germanium profile
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Measurement and simulation of boron diffusion in strained Si1-xGex epitaxial layers with linearly graded germanium profile
Krishnasamy, Rajendran; Schoenmaker, Wim (2000) -
Measurement and simulation of boron diffusivity in strained Si1-xGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim (2000) -
Measurement and simulation of boron diffusivity in strained Si1-XGex epitaxial layers
Krishnasamy, Rajendran; Schoenmaker, Wim (2001) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998) -
Mechanical stress evolution and the Blech length: 2D simulation of early electromigration effects
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Salm, C. (1998)