Browsing by author "Martino, Joao Antonio"
Now showing items 21-40 of 52
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Extraction of the oxide charge density at front and back interfaces of SOI NMOSFET devices
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2001) -
Extraction of the silicon film thickness on fully depleted SOI nMOSFETs using the black gate influence
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2000) -
Harmonic distortion of 2-MOS structures for MOSFET-C filters implemented with n-type unstrained and strained FINFETS
Doria, Rodrigo Trevisoli; Simoen, Eddy; Claeys, Cor; Martino, Joao Antonio; Pavanello, Marcelo Antonio (2011) -
High lateral electric field impact on the performance of Si-platform-based Ge pFinFETs
Oliveira, Alberto; Agopian, Paula GD; Martino, Joao Antonio; Simoen, Eddy; Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Claeys, Cor (2017) -
Impact of InxGa1-x composition and source Zn diffusion temperature on intrinsic voltage gain in InGaAs TFETs
Mendes Bordallo, Caio Cesar; Martino, Joao Antonio; Agopian, Paula G.D.; Alian, AliReza; Mols, Yves; Rooyackers, Rita; Vandooren, Anne; Verhulst, Anne; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron (2016) -
Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes
Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini der Agopian, Paula; Martino, Joao Antonio; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016) -
Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1996) -
Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1997) -
Influence of fin width on the intrinsic voltage gain of standard and strained triple-gate nFinFETs
Pavanello, Marcelo Antonio; Martino, Joao Antonio; Simoen, Eddy; Rooyackers, Rita; Collaert, Nadine; Claeys, Cor (2008) -
Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes
Mendes Bordallo, Ciao Cesar; Sivieri, Victor B.; Martino, Joao Antonio; Agopian, Paula G. D.; Rooyackers, Rita; Vandooren, Anne; Simoen, Eddy; Thean, Aaron; Claeys, Cor (2016) -
Intrinsic voltage gain of Line-TFETs and comparison with other TFET and MOSFET architectures
Agopian, Paula; Rooyackers, Rita; Martino, Joao Antonio; Vandooren, Anne; Simoen, Eddy; Claeys, Cor; Thean, Aaron (2016) -
Low frequency noise and fin width study of Si passivated Ge pFinFETs
Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini Der Agopian, Paula; Martino, Joao Antonio; Mitard, Jerome; Witters, Liesbeth; Langer, Robert; Collaert, Nadine; Claeys, Cor; Thean, Aaron (2016) -
Low frequency noise performance of horizontal, stacked and vertical silicon nanowire MOSFETs
Simoen, Eddy; de Oliveira, Alberto Vinicius; Der Agopian, Paula Ghedini; Ritzenthaler, Romain; Mertens, Hans; Horiguchi, Naoto; Martino, Joao Antonio; Claeys, Cor; Veloso, Anabela (2021) -
Low temperature operation of 0.13 μm partially-depleted SOI nMOSFETs with floating body
Pavanello, M. A.; Martino, Joao Antonio; Mercha, Abdelkarim; Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; van Meer, Hans; De Meyer, Kristin (2002) -
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Dos Santos, Sara; Cretu, Bogdan; Strobel, Vincent; Routoure, Jean-Marc; Carin, Regis; Martino, Joao Antonio; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor (2014) -
Low-frequency noise assessment of different Ge pFinFET STI processes
Oliveira, Alberto; Simoen, Eddy; Mitard, Jerome; Agopian, Gaula G.D.; Martino, Joao Antonio; Langer, Robert; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016) -
MISHEMT intrinsic voltage gain under multiple channel output characteristics
Canales, Bruno Godoy; Perina, Welder Fernandes; Martino, Joao Antonio; Simoen, Eddy; Peralagu, Uthayasankaran; Collaert, Nadine; Der Agopian, Paula Ghedini (2023) -
Mobility degradation influence on the SOI MOSFET channel length extraction at 77 K
Nicolett, A. S.; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (1996) -
NW-TFET analog performance for different gate oxide thickness and Ge source
Neves Souza, Felipe; Agopian, Paula G.D.; Martino, Joao Antonio; Rooyackers, Rita; Vandooren, Anne; Simoen, Eddy; Thean, Aaron; Claeys, Cor (2014) -
On the assessment of electrically active defects in high-mobility materials and devices
Simoen, Eddy; Eneman, Geert; Oliveira, Alberto V.; Ni, Kai; Mitard, Jerome; Witters, Liesbeth; Agopian, Paula G D; Martino, Joao Antonio; Fleetwood, Dan; Schrimpf, Ronald; Reed, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016)