Browsing by author "Schulze, Andreas"
Now showing items 21-40 of 124
-
Conductive-AFM tomography for 3D filament observation in resistive switching devices
Celano, Umberto; Goux, Ludovic; Belmonte, Attilio; Schulze, Andreas; Opsomer, Karl; Detavernier, Christoph; Richard, Olivier; Bender, Hugo; Jurczak, Gosia; Vandervorst, Wilfried (2013) -
Counting dopants/atoms in 2D/3D nanoscale structures
Vandervorst, Wilfried; Eyben, Pierre; Schulze, Andreas; Kambham, Ajay Kumar; Koelling, Sebastian; Gilbert, Matthieu (2010) -
Development and optimization of FIB-based sample preparation for SSRM
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2010) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Joerg; Vandervorst, Wilfried (2010) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011) -
Development of a dedicated software for the quantification of two-dimensional high vacuum scanning spreading resistance microscopy measurements
Eyben, Pierre; Clarysse, Trudo; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2012) -
Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013) -
Diamond electrical probes with sub-nanometer spatial resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Yeghoyan, Taguhi; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2016) -
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Xu, Zheng; Paredis, Kristof; Schulze, Andreas; Vandervorst, Wilfried (2015) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Diamond tips for electrical AFM measurements with sub-nanometer resolution
Hantschel, Thomas; Tsigkourakos, Menelaos; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Schulze, Andreas; Vandervorst, Wilfried (2014) -
Diamond tips for electrical probing on the nanometer scale
Hantschel, Thomas; Arstila, Kai; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2011) -
Direct and indirect optical transitions in bulk and atomically thin MoS2 studied by photoreflectance and photoacoustic spectroscopy
Kopaczek, Jan; Zelewski, Szymon; Polak, Maciej; Gawlik, Andrzej; Chiappe, Daniele; Schulze, Andreas; Caymax, Matty; Kudrawiec, Robert (2019) -
Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon
Koelling, Sebastian; Richard, Olivier; Bender, Hugo; Uematsu, M.; Schulze, Andreas; Zschaetzsch, Gerd; Gilbert, Matthieu; Vandervorst, Wilfried (2013) -
Dopant and carrier profiling for 3D-device architectures
Mody, Jay; Kambham, Ajay Kumar; Zschaetzsch, Gerd; Chiarella, Thomas; Collaert, Nadine; Witters, Liesbeth; Eyben, Pierre; Gilbert, Matthieu; Koelling, Sebastian; Schulze, Andreas; Hoffmann, Thomas Y.; Vandervorst, Wilfried (2011) -
Dopant and carrier profiling in FinFET-based devices with sub-nanometer resolution
Mody, Jay; Kambham, Ajay Kumar; Zschaetzsch, Gerd; Schatzer, Philipp; Chiarella, Thomas; Collaert, Nadine; Witters, Liesbeth; Jurczak, Gosia; Horiguchi, Naoto; Gilbert, Matthieu; Eyben, Pierre; Koelling, Sebastian; Schulze, Andreas; Hoffmann, Thomas Y.; Vandervorst, Wilfried (2010) -
Dopant/carrier profiling for 3D-structures
Vandervorst, Wilfried; Schulze, Andreas; Kambham, Ajay Kumar; Mody, Jay; Gilbert, Matthieu; Eyben, Pierre (2014) -
Dopant/carrier profiling in nanostructures
Vandervorst, Wilfried; Eyben, Pierre; Schulze, Andreas; Mody, Jay; Koelling, Sebastian; Kambham, Ajay Kumar; Gilbert, Matthieu (2010) -
Edge-enhanced Raman scattering in narrow sGe fin field-effect transistor channels
Nuytten, Thomas; Hantschel, Thomas; Kosemura, Daisuke; Schulze, Andreas; De Wolf, Ingrid; Vandervorst, Wilfried (2015) -
Effect of initial growth and seeding conditions on boron doped hot filament diamond
Zimmer, Jerry; Hantschel, Thomas; Chandler, Gerry; Schulze, Andreas; Vandervorst, Wilfried; Peralta, Maria (2011)