Browsing by author "Fleischmann, Claudia"
Now showing items 21-40 of 104
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APT tip shape modifications during analysis, its implications, and the potential to measure tip shapes in real time via soft-X-ray ptychography
van der Heide, Paul; Makhotkin, Igor; Vandervorst, Wilfried; Fleischmann, Claudia (2019) -
Atom probe conditions for stoichiometric quantification of GaN and Al1 xGaxN
Morris, Richard; Arnoldi, Laurent; Cuduvally, Ramya; Melkonyan, Davit; Fleischmann, Claudia; Zhao, Ming; Vandervorst, Wilfried (2017) -
Atom probe tomography analysis of SiGe fins embedded in SiO2: facts and artefacts
Melkonyan, Davit; Fleischmann, Claudia; Arnoldi, Laurent; Demeulemeester, Jelle; Kumar, Arul; Bogdanowicz, Janusz; Vurpillot, Francois; Vandervorst, Wilfried (2017) -
Atom probe tomography for advanced nanoelectronic devices: current status and perspectives
Barnes, J.P.; Grenier, A.; Mouton, I.; Barraud, S; Audoit, G.; Bogdanowicz, Janusz; Fleischmann, Claudia; Melkonyan, Davit; Vandervorst, Wilfried; Duguay, S.; Roland, N.; Vurpillot, F; Blavette, D (2018) -
Atom probe tomography for advanced semiconductor technology research
Fleischmann, Claudia; Melkonyan, Davit; Arnoldi, Laurent; Morris, Richard; Bogdanowicz, Janusz; Vandervorst, Wilfried (2017) -
Atom probe tomography on contemporary semiconductor devices: Challenges in data acquisition, quantification and spatial accuracy
Scheerder, Jeroen; Fleischmann, Claudia; Dialameh, Masoud; Melkonyan, Davit; Morris, Richard; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Atomic layer deposition of high-k dielectrics on sulphur-passivated germanium
Sioncke, Sonja; Lin, Dennis; Nyns, Laura; Brammertz, Guy; Delabie, Annelies; Conard, Thierry; Franquet, Alexis; Meuris, Marc; Struyf, Herbert; De Gendt, Stefan; Heyns, Marc; Fleischmann, Claudia; Temst, Kristiaan; Vantomme, Andre; Muller, Matthias; Kobe, Michael; Beckhoff, Burkhard; Caymax, Matty (2011) -
Atomic scale investigation of the oxidation and sulfidation processes of Ge(100) surfaces
Fleischmann, Claudia (2011-12) -
Automated calibration of model-driven reconstructions in atom probe tomography
Fletcher, Charles; Moody, Michael P.; Fleischmann, Claudia; Dialameh, Masoud; Porret, Clément; Geiser, Brian; Haley, Daniel (2022) -
Bipolar device fabrication using a scanning tunnelling microscope
Skeren, Tomas; Koester, Sigrun; Douhard, Bastien; Fleischmann, Claudia; Fuhrer, Andreas (2020) -
Challenges for APT in advanced semiconductor technology research
Melkonyan, Davit; Fleischmann, Claudia; Bogdanowicz, Janusz; Arnoldi, Laurent; Kumar, Arul; Vurpillot, Francois; Vandervorst, Wilfried (2016) -
Challenges on surface conditioning in 3D device architectures: triple-gate FinFETs, gate-all-around lateral and vertical nanowire FETs
Veloso, Anabela; Paraschiv, Vasile; Vecchio, Emma; Devriendt, Katia; Li, Waikin; Simoen, Eddy; Chan, BT; Tao, Zheng; Rosseel, Erik; Loo, Roger; Milenin, Alexey; Kunert, Bernardette; Teugels, Lieve; Sebaai, Farid; Lorant, Christophe; van Dorp, Dennis; Altamirano Sanchez, Efrain; Brus, Stephan; Marien, Philippe; Fleischmann, Claudia; Melkonyan, Davit; Huynh Bao, Trong; Eneman, Geert; Hellings, Geert; Sibaja-Hernandez, Arturo; Matagne, Philippe; Waldron, Niamh; Mocuta, Dan; Collaert, Nadine (2017) -
Characterization of high-k nanolayers by grazing incidence X-ray spectrometry
Müller, Matthias; Hönicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia (2014) -
Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Hermann, Peter; Hoehl, Arne; Ulrich, Georg; Fleischmann, Claudia; Hermelink, Antje; Kästner, Bernd; Patoka, Piotr; Hornemann, Andrea; Beckhoff, Burkhard; Rühl, Eckart; Ulm, Gerhard (2014) -
Correcting the boron concentration for the detection losses through multi hit events.
Melkonyan, Davit; Fleischmann, Claudia; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2018) -
Development and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques
Dialameh, Masoud; Ferrarese Lupi, Federico; De Leo, Natascia; Boarino, Luca; Hönicke, Philipp; Kayser, Yves; Beckhoff, Burkhard; Weimann, Thomas; Fleischmann, Claudia; Vandervorst, Wilfried (2017) -
Development and synchrotron-based characterization of Al and Cr nanostructures as potential calibration samples for 3D analytical techniques
Dialameh, Masoud; Ferrarese Lupi, Federico; Hönicke, Philipp; Kayser, Yves; Beckhoff, Burkhard; Weimann, Thomas; Fleischmann, Claudia; Vandervorst, Wilfried; Dub "cek, Pavo; Pivac, Branko; Perego, Michele; Seguini, Gabriele; De Leo, Natascia; Boarino, Luca (2018) -
Dopant, composition and carrier profiling for 3D-structures
Vandervorst, Wilfried; Fleischmann, Claudia; Bogdanowicz, Janusz; Celano, Umberto; Paredis, Kristof; Budrevich, A (2017) -
Emitter shape evolution during field evaporation and its impact on the reconstructed data of SiGe fins embedded in SiO2
Melkonyan, Davit; Arnoldi, Laurent; Fleischmann, Claudia; Kumar, Arul; Vurpillot, Francois; Bogdanowicz, Janusz; Vandervorst, Wilfried (2016) -
Enabling the high-performance InGaAs/Ge CMOS: a common gate stack solution
Lin, Dennis; Brammertz, Guy; Sioncke, Sonja; Fleischmann, Claudia; Delabie, Annelies; Martens, Koen; Bender, Hugo; Conard, Thierry; Tseng, Joshua; Lin, Vic; Wang, Wei-E; Temst, Kristiaan; Vantomme, Andre; Mitard, Jerome; Caymax, Matty; Meuris, Marc; Heyns, Marc; Hoffmann, Thomas Y. (2009)