Browsing by author "Brammertz, Guy"
Now showing items 21-40 of 221
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Ammonium sulfide vapor passivation of In0.53Ga0.47As and InP surfaces
Alian, AliReza; Brammertz, Guy; Merckling, Clement; Firrincieli, Andrea; Wang, Wei-E; Lin, Dennis; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2011) -
Analysis of border traps in high-k gate dielectrics on high-mobility channels
Simoen, Eddy; Lin, Dennis; Alian, AliReza; Brammertz, Guy; Merckling, Clement; Mitard, Jerome; Claeys, Cor (2013) -
Atomic layer deposition of HfO2 thin films on InxGa1-xAs
O'Mahony, A.; O'Connor, E.; Long, R.; Thomas, K.; Povey, I.M.; Hurley, P.K.; Pemble, M.E.; Brennan, B.; Hughes, G.; Brammertz, Guy; Afanas'ev, V.V. (2008) -
Atomic layer deposition of high-k dielectric layers on Ge and III-V MOS channels
Delabie, Annelies; Alian, AliReza; Bellenger, Florence; Brammertz, Guy; Brunco, David; Caymax, Matty; Conard, Thierry; Franquet, Alexis; Houssa, Michel; Sioncke, Sonja; Van Elshocht, Sven; van Hemmen, J.L.; Keuning, W.; Kessels, W.M.M.; Afanas'ev, V.V.; Stesmans, Andre; Heyns, Marc; Meuris, Marc (2008) -
Atomic layer deposition of high-k dielectric layers on Ge and III-V MOS channels
Delabie, Annelies; Caymax, Matty; Bellenger, Florence; Brammertz, Guy; Conard, Thierry; Houssa, Michel; Sioncke, Sonja; Van Elshocht, Sven; Heyns, Marc; Meuris, Marc; Brunco, David; van Hemmen, J.L.; Keuning, W.; Kessels, W.M.M.; Afanas'ev, V.V.; Stesmans, Andre (2008) -
Atomic layer deposition of high-k dielectrics on sulphur-passivated germanium
Sioncke, Sonja; Lin, Dennis; Nyns, Laura; Brammertz, Guy; Delabie, Annelies; Conard, Thierry; Franquet, Alexis; Meuris, Marc; Struyf, Herbert; De Gendt, Stefan; Heyns, Marc; Fleischmann, Claudia; Temst, Kristiaan; Vantomme, Andre; Muller, Matthias; Kobe, Michael; Beckhoff, Burkhard; Caymax, Matty (2011) -
Band offsets at interfaces of (100)InxGa1-xAs (0<x<0.53) with Al2O3 and HfO2
Afanasiev, Valeri; Stesmans, Andre; Brammertz, Guy; Delabie, Annelies; Sioncke, Sonja; O'Mahony, E; Povey, I.M.; Pemble, M.E.; O'Connor, E.; Hurley, P.K.; Newcomb, S.B. (2009) -
Bias dependent admittance spectroscopy of thin film solar cells: KF post deposition treatment, accelerated lifetime testing, and their effect on the CVf loss maps
Kohl, Thierry; Brammertz, Guy; de Wild, Jessica; Buldu, Dilara Gokcen; Birant, Gizem; Meuris, Marc; Poortmans, Jef; Vermang, Bart (2021) -
Bias dependent admittance spectroscopy: the impact of sodium supply on the Cu(In,Ga)Se-2 growth
Kohl, Thierry; de Wild, Jessica; Brammertz, Guy; Buldu, Dilara Gokcen; Birant, Gizem; van der Vleuten, M.; Simor, M.; Eachambadi, R. T.; Manca, J.; Meuris, Marc; Poortmans, Jef; Vermang, Bart (2021) -
Bias-dpendant admittance spectroscopy of thin-film solar cells: Experiment and simulation
Brammertz, Guy; Kohl, Thierry; de Wild, Jessica; Buldu, Dilara Gokcen; Birant, Gizem; Meuris, Marc; Poortmans, Jef; Vermang, Bart (2020) -
Border traps in Ge/III-V channel devices: Analysis and reliability aspects
Simoen, Eddy; Lin, Dennis; Alian, AliReza; Brammertz, Guy; Merckling, Clement; Mitard, Jerome; Claeys, Cor (2013) -
Capacitance-voltage (CV) characterization of GaAs-oxide interfaces
Brammertz, Guy; Martens, Koen; Lin, Dennis; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Merckling, Clement; Penaud, J.; Alian, AliReza; Sioncke, Sonja; Wang, Wei-E; Meuris, Marc; Caymax, Matty; Heyns, Marc (2008) -
Capacitance-voltage (CV)characterization of GaAs-oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage and conductance analysis of high-k/InxGa1-xAs structures (x = 0, 0.15, 0.3, and 0.53)
Hurley, P.K.; O'Connor, E.; Monaghan, S.; Long, R.D.; O'Mahony, A.; Povey, I.M.; Cherkaoui, K.; Pemble, M.E.; MacHale, J.; Quinn, A.J.; Brammertz, Guy; Heyns, Marc; Newcomb, S.B.; Afanasiev, Valeri (2009) -
Capacitance-voltage characterization of GaAs-Al2O3 interfaces
Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Sioncke, Sonja; Delabie, Annelies; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage characterization of GaAs-Oxide interfaces
Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Catalytic forming gas anneal on III-V/Ge MOS sytems
Wang, Wei-E; Lin, Han-Chung; Brammertz, Guy; Delabie, Annelies; Simoen, Eddy; Caymax, Matty; Meuris, Marc; Heyns, Marc (2009) -
Chalcogenides and their application in thin film photovoltaics
Brammertz, Guy (2014) -
Challenge in Cu-rich CuInSe2 thin film solar cells: Defect caused by etching
ElAnzeery, Hossam; Melchiorre, Michele; Sood, Mohit; Babbe, Finn; Werner, Florian; Brammertz, Guy; Siebentritt, Susanne (2019)