Browsing by author "Garbar, N."
Now showing items 21-40 of 44
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Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1997) -
Interface trap related generation-recombination noise in submicron buried-channel SOI pMOSFETs
Claeys, Cor; Simoen, Eddy; Lukyanchikova, N.; Petrichuk, M.; Garbar, N. (1994) -
Investigation of tri-gate FinFETs by noise methods
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2011) -
Linear kink effect Lorentzians in the noise spectra of n- and p-channel fin field-effect transistors processed in standard and strained silicon-on-insulator substrates
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Claeys, Cor; Simoen, Eddy (2009) -
Linear-kink-noise suppression in partially depleted SOI using the twin-gate MOSFET configuration
Simoen, Eddy; Claeys, Cor; Lukyanchikova, N.; Garbar, N.; Smolanka, A. (2005) -
LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2011) -
Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effects
Lukyanchikova, N.; Garbar, N.; Petrichuk, M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2003) -
Low-frequency 1/f noise behaviour of deep submicron n-MOSFETS
Simoen, Eddy; Biesemans, Serge; Claeys, Cor; De Meyer, Kristin; Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Kolarova, Renata; Vasina, Petr; Sikula, J. (1999) -
Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Lee, Shih Chung; Simoen, Eddy; Claeys, Cor (2005) -
Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2008) -
Low-Frequency Noise in SOI p-MOSFETs Prepared on SIMOX and ZMR Substrates
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1995) -
Low-frequency noise of strained and non-strained n-channel tri-gate FinFETs with different gate dielectrics
Lukynachikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Simoen, Eddy; Claeys, Cor (2009) -
On the 1/f noise of triple-gate field-effect transistors with high-k gate dielectric
Lukyanchikova, N.; Garbar, N.; Kudina, V.; Smolanka, A.; Put, Sofie; Claeys, Cor; Simoen, Eddy (2009) -
On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistors
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Mercha, Abdelkarim; van Meer, Hans; De Meyer, Kristin; Claeys, Cor (2002) -
On the physical mechanisms responsible for a novel class of floating body effects in silicon-on-insulator MOSFETs
Mercha, Abdelkarim; Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; Lukyanchikiva, N.; Petrichuk, M.; Garbar, N. (2003) -
Origin of the front-back gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate
Lukyanchikova, N.; Garbar, N.; Smolanka, A.; Lokshin, M.; Simoen, Eddy; Claeys, Cor (2005) -
Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1996) -
Results of noise examination of fully-depleted accumulation-mode SOI pMOSFETs
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1995) -
RTS diagnostics of source-drain (edge?) related defects in submicron n-MOSFETs
Lukyanchikova, N.; Petrichuk, M. V.; Garbar, N.; Simoen, Eddy; Claeys, Cor (1997) -
RTS noise due to lateral isolation related defects in submicron
Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Claeys, C. (1998)