Browsing by author "Hellemans, L."
Now showing items 21-40 of 49
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Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tips
De Wolf, Peter; Snauwaert, Johan; Hellemans, L.; Clarysse, Trudo; Vandervorst, Wilfried; D'Olieslaeger, Marc; Quaeyhaegens, D. (1995) -
Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Trenkler, Thomas; De Wolf, Peter; Snauwaerts, Jan; Qamhieh, Z.; Vandervorst, Wilfried; Hellemans, L. (1995) -
Low weight spreading resistance profiling of ultra-shallow dopant profiles
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1997) -
Low weight spreading resistance profiling of ultrashallow dopant profiles
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1998) -
Minimizing the size of force-controlled point contacts on silicon for carrier profiling
Snauwaert, Johan; Blanc, N.; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1996) -
Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling
Snauwaerts, Jan; Blanc, N.; De Wolf, Peter; Hellemans, L. (1995) -
Nanopotentiometry - Local potential measurements in CMOS transistors using atomic force spectroscopy
Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1997) -
Nanopotentiometry: data interpretation and quantification
Haegeman, Bart; Trenkler, Thomas; Eyben, Pierre; Vandervorst, Wilfried; De Wolf, Peter; Hellemans, L. (1999) -
Nanopotentiometry: Local potential measurements in complementary metal-oxide-semiconductor transistors using atomic force microscopy
Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1998) -
New aspects of nanopotentiometry for complementary metal-oxide-semiconductor transistors
Trenkler, Thomas; Stephenson, Robert; Jansen, Philippe; Vandervorst, Wilfried; Hellemans, L. (2000) -
New aspects of nanopotentiometry for MOSFET transistors
Trenkler, Thomas; Stephenson, Robert; Jansen, Philippe; Vandervorst, Wilfried; Hellemans, L. (1999) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
On the Determination of Two-Dimensional Carrier Distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
One and two-dimensional carrier profiling in semiconductors by nano-SRP
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1995) -
One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1996) -
Overview of 2D profiling in Imec
Duhayon, Natasja; Eyben, Pierre; Alvarez, David; Fouchier, Marc; Blasco, X.; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2003) -
Quantitative carrier profiling of silicon devices by nano-srp
De Wolf, Peter; Clarysse, Trudo; Caymax, Matty; Vandervorst, Wilfried; Snauwaerts, Jan; Hellemans, L. (1996) -
Sensitive light scattering as a semiquantitative method for studying photoresist stripping
Rotondaro, Antonio; Meuris, Marc; Schmidt, Harald; Heyns, Marc; Claeys, C.; Hellemans, L.; Snauwaert, L. (1995) -
Silicon surface roughening by the decomposition of hydrogen peroxide
Schmidt, Harald; Meuris, Marc; Mertens, Paul; Verhaverbeke, Steven; Heyns, Marc; Hellemans, L.; Snauwaert, J.; Dillenbeck, C. (1994)