Browsing by author "Spampinato, Valentina"
Now showing items 21-40 of 74
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Combined AFM and ToF-SIMS analyses for the study of filaments in organic resistive switching memories
Busby, Yan; Franquet, Alexis; Spampinato, Valentina; Casula, Giulia; Bonfiglio, Annalisa; Cosseddu, Piero; Pireaux, Jean-Pireaux; Houssiau, Laurent (2018) -
Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
Conard, Thierry; Franquet, Alexis; Spampinato, Valentina; Op de Beeck, Jonathan; Celano, Umberto; Vandervorst, Wilfried; Moeler, Rudolf; Labyedh, Nouha; Vereecken, Philippe (2017) -
Combined TOF-SIMS/SPM characterization of the electron conductive structures in centimeter long and filamentous Cable Bacteria
Thiruvallur Eachambadi, Raghavendran; Boschker, Henricus; Franquet, Alexis; Spampinato, Valentina; Hidalgo-Martinez, Silvia; Meysman, Filip; Manca, Jean (2019) -
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism
Serron, Jill; Minj, Albert; Spampinato, Valentina; Franquet, Alexis; Rybalchenko, Yevhenii; Boulon, Marie-Emmanuelle; Brems, Steven; Shi, Yuanyuan; Groven, Benjamin; Villarreal, Renan; Conard, Thierry; van der Heide, Paul; Hantschel, Thomas; Medina Silva, Henry (2023-05-17) -
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
Spampinato, Valentina; Shi, Yuanyuan; Serron, Jill; Minj, Albert; Groven, Benjamin; Hantschel, Thomas; van der Heide, Paul; Franquet, Alexis (2023) -
Correlative Analysis in The Semiconductor Industry
Larson, D.J.; Prosa, T.J.; Martin, I.; Merkulov, A.; Robbes, A.S.; Dulac, O.; Bernier, N.; Delaye, V.; Franquet, Alexis; van der Heide, Paul; Spampinato, Valentina; Vandervorst, Wilfried (2019) -
Correlative Analysis in The Semiconductor Industry
Larson, D; Prosa, T; Martin, I; Merkulov, A; Robbes, A; Dulac, O; Bernier, N; Delaye, V; Franquet, Alexis; van der Heide, Paul; Spampinato, Valentina; Vandervorst, Wilfried (2019) -
Defect Mitigation in Area-Selective Atomic Layer Deposition of Ruthenium on Titanium Nitride/Dielectric Nanopatterns
Soethoudt, Job; Hody, Hubert; Spampinato, Valentina; Franquet, Alexis; Briggs, Basoene; Chan, BT; Delabie, Annelies (2019) -
Defect mitigation solution for area-selective ALD of Ru on TiN/SiO2 nanopatterns
Soethoudt, Job; Grillo, Fabio; Marques, Esteban; Van Ommen, Ruud; Briggs, Basoene; Hody, Hubert; Spampinato, Valentina; Franquet, Alexis; Chan, BT; Delabie, Annelies (2019) -
Depth profiling intrinsically hybrid layers and organic/inorganic stacks by variable-size argon clusters: a ToF-SIMS and XPS study
Busby, Yan; Noel, Celine; Franquet, Alexis; Spampinato, Valentina; Felten, Alexandre; Houssiau, Laurent (2018) -
Depth profiling of sub-100 nm structures: New dimensions in data understanding through the combination of ToF-SIMS with in-situ AFM
Conard, Thierry; Spampinato, Valentina; Franquet, Alexis; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors
Op de Beeck, Jonathan; Labyedh, Nouha; Sepulveda Marquez, Alfonso; Spampinato, Valentina; Franquet, Alexis; Conard, Thierry; Vereecken, Philippe; Celano, Umberto (2018) -
Effects of Cs+ and Ar-n(+) ion bombardment on the damage of graphite crystals
Branchini, Paolo; Spampinato, Valentina; Franquet, Alexis; Bussetti, Gianlorenzo; Tortora, Luca; De Rosa, Stefania (2022) -
Efficient long-range conduction in cable bacteria through nickel protein wires
Boschker, Henricus T. S.; Cook, Perran L. M.; Polerecky, Lubos; Eachambadi, Raghavendran Thiruvallur; Lozano, Helena; Hidalgo-Martinez, Silvia; Khalenkow, Dmitry; Spampinato, Valentina; Claes, Nathalie; Kundu, Paromita; Wang, Da; Bals, Sara; Sand, Karina K.; Cavezza, Francesca; Hauffman, Tom; Bjerg, Jesper Tataru; Skirtach, Andre G.; Kochan, Kamila; McKee, Merrilyn; Wood, Bayden; Bedolla, Diana; Gianoncelli, Alessandra; Geerlings, Nicole M. J.; Van Gerven, Nani; Remaut, Han; Geelhoed, Jeanine S.; Millan-Solsona, Ruben; Fumagalli, Laura; Nielsen, Lars Peter; Franquet, Alexis; Manca, Jean V.; Gomila, Gabriel; Meysman, Filip J. R. (2021) -
Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable Bacteria
Eachambadi, Raghavendran Thiruvallur; Boschker, Henricus T. S.; Franquet, Alexis; Spampinato, Valentina; Hidalgo-Martinez, Silvia; Valcke, Roland; Meysman, Filip J. R.; Manca, Jean, V (2021) -
Ferroelectric La-Doped ZrO2/HfxZr1-xO2 Bilayer Stacks with Enhanced Endurance
Popovici, Mihaela Ioana; Walke, Amey; Banerjee, Kaustuv; Ronchi, Nicolo; Meersschaut, Johan; Celano, Umberto; McMitchell, Sean; Spampinato, Valentina; Franquet, Alexis; Favia, Paola; Swerts, Johan; Van den Bosch, Geert; Van Houdt, Jan (2021) -
First demonstration of ~3500 cm2/V-s electron mobility and sufficient BTI reliability (max Vov up to 0.6V) In0.53Ga0.47As nFET using an IL/LaSiOx/HfO2 gate stack
Sioncke, Sonja; Franco, Jacopo; Vais, Abhitosh; Putcha, Vamsi; Nyns, Laura; Sibaja-Hernandez, Arturo; Rooyackers, Rita; Calderon Ardila, Sergio; Spampinato, Valentina; Franquet, Alexis; Maes, Willem; Xie, Qi; Givens, Michael; Tang, Fu; Jiang, X.; Heyns, Marc; Linten, Dimitri; Mitard, Jerome; Thean, Aaron; Mocuta, Dan; Collaert, Nadine (2017) -
GHz-Scanning Acoustic Microscopy combined with TOFSIMS/AFM for wafer-level failure analysis of bonding interfaces
De Wolf, Ingrid; Khaled, Ahmad; Franquet, Alexis; Spampinato, Valentina; Conard, Thierry; Brand, Sebastian; Kögel, Michael; Wiesler, Ingo (2019) -
Hybrid perovskites depth profiling with variable-size argon clusters and monatomic ion beams
Noel, Celine; Busby, Yan; Franquet, Alexis; Spampinato, Valentina; Houssiau, Laurent (2019) -
Hybrid perovskites depth profiling with variable-size argon clusters and monatomic ions beams
Noel, Celine; Pescetelli, Sara; Agresti, Antonio; Franquet, Alexis; Spampinato, Valentina; Felten, Alexandre; Di Carlo, Aldo; Houssiau, Laurent; Busby, Yan (2019)