Browsing by author "Deferm, Ludo"
Now showing items 41-60 of 90
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High-energy particle irradiation effects in 0.5µm BICMOS polysilicon emitter bipolar junction transistors
Simoen, Eddy; Decoutere, Stefaan; Merron, B.; Deferm, Ludo; Claeys, Cor; Berger, G.; Ryckewaert, G.; Ohyama, Hidenori; Sunaga, H. (1998) -
High-temperature reliability behavior of SSI-flash EEPROM devices
De Blauwe, Jan; Wellekens, Dirk; Groeseneken, Guido; Haspeslagh, Luc; Van Houdt, Jan; Deferm, Ludo; Maes, Herman (1997) -
Impact of polysilicon emitter interfacial layer engineering on the 1/f noise of bipolar transistors
Simoen, Eddy; Decoutere, Stefaan; Cuthbertson, Alan; Claeys, Cor; Deferm, Ludo (1996) -
Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1997) -
Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes
Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1999) -
Impact of substrate resistivity on the high frequency performance of metal interconnect
Jenei, Snezana; Kol'dyaev, Victor; Decoutere, Stefaan; Kuhn, Rudiger; Deferm, Ludo (1999) -
Impact of the transmission line properties of a metal-ultrathin silicon dioxide-semiconductor field-effect transistor on the extracted inversion-layer thickness
Kol'dyaev, Victor; Clerix, Andre; Deferm, Ludo; Van Overstraeten, Roger (1998) -
Importance of determining the polysilicon dopant profile during process development
Debusschere, Ingrid; Deferm, Ludo; Vandervorst, Wilfried (1996) -
Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization
Van den Bosch, Geert; Deferm, Ludo; Forester, Lynn; Collins, Tom (1994) -
Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology
Bock, Karlheinz; Russ, Christian; Badenes, Gonçal; Groeseneken, Guido; Deferm, Ludo (1997) -
Integration aspects of advanced CMOS processes
Deferm, Ludo (1998) -
Integration challenges in sub-0.25μm CMOS-based technologies
Badenes, Gonçal; Deferm, Ludo (2000) -
Integration difficulties and limitations in sub-0.25μm CMOS-based technologies
Deferm, Ludo; Badenes, Gonçal (2000) -
Integration of Pt/PZT/Pt ferroelectric capacitors into 0.5μm CMOS process for embedded FERAM
Wouters, Dirk; Norga, Gerd; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (1999) -
Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
Van Houdt, Jan; Wellekens, Dirk; Vanhorebeek, Guido; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1995) -
Investigation of HF noise figure reduction of SiGe HBTs using actualised physical models
Decoutere, Stefaan; Poortmans, Jef; Deferm, Ludo; Nijs, Johan (1995) -
Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Kubicek, Stefan; Henson, W. K.; De Keersgieter, An; Badenes, Gonçal; Jansen, Philippe; van Meer, Hans; Kerr, Daniel; Naem, Abdalla; Deferm, Ludo; De Meyer, Kristin (1999) -
Investigation of the high frequency noise figure reduction of SiGe heterojunction bipolar transistors using actualised physical models
Decoutere, Stefaan; Poortmans, Jef; Deferm, Ludo; Nijs, Johan (1995) -
It's Europe's turn now
Deferm, Ludo (2001) -
Low temperature operation as a tool to investigate second order effects in submicron MOSFET's
Gutierrez, Edmundo; Deferm, Ludo (1994)