Browsing imec Publications by title

Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability

Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2016)

Quantification of shot noise contributions to contact hole local CD non-uniformity

Gronheid, Roel; Winroth, Gustaf; Vaglio Pret, Alessandro; Younkin, Todd (2012)

Quantification of spin-charge interconversion in highly resistive sputtered BixSe1-x with nonlocal spin valves

Arango, Isabel C.; Choi, Won Young; Pham, Van Tuong; Groen, Inge; Vaz, Diogo C.; Debashis, Punyashloka; Li, Hai; Mahendra, D. C.; Oguz, Kaan; Chuvilin, Andrey; Hueso, Luis E.; Young, Ian A.; Casanova, Felix (2023)

Quantification of the infra-red response of various cell technologies on the energy yield

Goverde, Hans; Govaerts, Jonathan; Horvath, Imre T; Aldalali, Bader; Voroshazi, Eszter; Szlufcik, Jozef; Catthoor, Francky; Poortmans, Jef (2018)

Quantification problems in light element determination by grazing emission X-ray fluorescence

Kuczumow, A.; Claes, M.; Schmeling, M.; Van Grieken, R.; De Gendt, Stefan (2000)

Quantified Uniformity and Selectivity of TiO2 Films in 45-nm Half Pitch Patterns Using Area-Selective Deposition Supercycles

Nye, Rachel; Van Dongen, Kaat; de Marneffe, Jean-Francois; Parsons, Gregory N. N.; Delabie, Annelies (2023)

Quantifying internal optical losses for 21% n-Si rear junction cells

Duerinckx, Filip; Aleman, Monica; Choulat, Patrick; Kuzma Filipek, Izabela; Cornagliotti, Emanuele; Szlufcik, Jozef (2014)

Quantifying LER and its impact on BEOL TDDB reliability at 20nm ½ pitch

Demuynck, Steven; Roussel, Philippe; Stucchi, Michele; Versluijs, Janko; Gishia, Gianni; Tokei, Zsolt; De Roest, David; Beyer, Gerald (2010)

Quantifying motion artifacts using a rotating Phantom: insights towards dynamic musculoskeletal applications

Keelson, Benymeen; Buzzatti, Luca; Lopez, Violeta Portero; Scheerlink, Thierry; Van Gompel, Gert; Cattrysse, Erik; de Mey, Johan; Vandemeulebroucke, Jef; Buls, Nico (2020)

Quantifying self-heating effects with scaling in globally strained Si MOSFETS

Agaiby, R.; Yang, Y.; Olsen, S.H.; O'Neill, A.G.; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor (2007)

Quantifying the aggregation factor in carbon nanotube dispersions by absorption spectroscopy

Pathangi Sriraman, Hari; Vereecken, Philippe; Klekachev, Alexander; Groeseneken, Guido; Witvrouw, Ann (2014)

Quantifying the benefits of selective wavelength regeneration in ultra long-haul WDM networks

Van Parys, Wim; Arijs, Peter; Antonis, O.; Demeester, Piet (2001)

Quantifying the errors due to overfilling for Newtonian fluids in rotational rheometry

Cardinaels, Ruth; Reddy, Naveen; Clasen, Christian (2019)

Quantifying the impact of optical interconnect latency on the performance of optoelectronic FPGAs

Dambre, Joni; Van Marck, H.; Van Campenhout, Jan (1999)

Quantifying the impact of optical interconnect latency on the performance of optoelectronic FPGAs

Dambre, J.; Van Marck, Herwig; Van Campenhout, Jan (1999)

Quantifying the performance of optoelectronic FPGA's: The impact of optical interconnect latency

Dambre, J.; Van Marck, Herwig; Van Campenhout, Jan (2000)

Quantifying the Ru area selective deposition in nanometer confined volumes using RBS

Claessens, Niels; Rahnemaihaghighi, Negin; Delabie, Annelies; Vandervorst, Wilfried; Vantomme, Andre; Meersschaut, Johan (2021)

Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry

Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E. J.; Considine, L. (2000)

Quantifying the smoothing of GaN epilayers in MOVPE growth by in-situ laser reflectometry

Stafford, A.; Irvine, S. J. C.; Bougrioua, Zahia; Jacobs, Koen; Moerman, Ingrid; Thrush, E. J.; Considine, L.; Crawley., J. (2000)

Quantifying Uncertainty and Improving Reliability of Time-Series Based Deep Learning Models

Werthen Brabants, Lorin (2023)