Browsing imec Publications by title

Two-dimensional carrier mapping at the nanometer-scale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy

Eyben, Pierre; Clarysse, Trudo; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2011)

Two-dimensional carrier mapping at the nanometerscale on 32nm node targeted p-MOSFETs using high vacuum scanning spreading resistance microscopy

Eyben, Pierre; Clarysse, Trudo; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Hantschel, Thomas; Vandervorst, Wilfried (2012)

Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopy

Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2012)

Two-dimensional carrier profile characterization for junction engineering in advanced devices

Eyben, Pierre; Vandervorst, Wilfried (2008)

Two-dimensional carrier profiling in advanced devices with pico-meter resolution

Vandervorst, Wilfried; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Hartwich, J.; Slesazech, S.; Verheyen, Peter; Hogg, S. (2004)

Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy

De Wolf, Peter; Geva, M.; Reynolds, C. L.; Hantschel, Thomas; Vandervorst, Wilfried; Bylsma, R. B. (1999)

Two-dimensional carrier profiling of semiconductor structures with nanometer resolution

De Wolf, Peter (1998-05)

Two-dimensional carrier profiling using scanning probe microscopy

Alvarez, David; Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Xu, Mingwei; Vandervorst, Wilfried (2002)

Two-dimensional carrier profiling using scanning probes

Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Fouchier, Marc; Xu, Mingwei (2002)

Two-dimensional carrier profiling with Scanning Capacitance Microscopy, industry-ready innovative research

Duhayon, Natasja; Vandervorst, Wilfried; Hellemans, L. (2003)

Two-dimensional carrier profiling with scanning probes

Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Clarysse, Trudo (2002)

Two-dimensional carrier profiling with sub-nm resolution using SSRM: from basic concept to TCAD calibration and device tuning

Eyben, Pierre; Vemula, Sri Charan; Noda, T.; Vandervorst, Wilfried (2009)

Two-dimensional crystal grain size tuning in WS2 atomic layer deposition: an insight in the nucleation mechanism

Groven, Benjamin; Nalin Mehta, Ankit; Bender, Hugo; Meersschaut, Johan; Nuytten, Thomas; Verdonck, Patrick; Conard, Thierry; Smets, Quentin; Schram, Tom; Schoenaers, Ben; Stesmans, Andre; Afanasiev, Valeri; Vandervorst, Wilfried; Heyns, Marc; Caymax, Matty; Radu, Iuliana; Delabie, Annelies (2018)

Two-dimensional dispersive beam steerer fabricated on silicon-on-insulator

Van Acoleyen, Karel; Bogaerts, Wim; Baets, Roel; Rogier, Hendrik (2010)

Two-dimensional dispersive off-chip beam scanner fabricated on silicon-on-insulator

Van Acoleyen, Karel; Bogaerts, Wim; Baets, Roel (2011)

Two-dimensional dopant profiling using scanning probe microscopy

Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)

Two-dimensional feature stochastic printing with mask deficiencies in high-NA EUV

Melvin III, Lawrence; Jonckheere, Rik; Hendrickx, Eric (2021)

Two-dimensional hexagonal tin: ab initio geometry, stability, electronic structure and functionalization

Van den Broek, Bas; Houssa, Michel; Scalise, Emilio; Pourtois, Geoffrey; Afanasiev, Valeri; Stesmans, Andre (2014)

Two-dimensional materials prospects for non-volatile spintronic memories

Yang, Hyunsoo; Valenzuela, Sergio O.; Chshiev, Mairbek; Couet, Sebastien; Dieny, Bernard; Dlubak, Bruno; Fert, Albert; Garello, Kevin; Jamet, Matthieu; Jeong, Dae-Eun; Lee, Kangho; Lee, Taeyoung; Martin, Marie-Blandine; Kar, Gouri Sankar; Seneor, Pierre; Shin, Hyeon-Jin; Roche, Stephan (2022)

Two-dimensional method of moments modelling of lossless overmoded transverse magnetic cavities

Laermans, Eric; Knockaert, Luc; De Zutter, Daniel (2004-02)