Browsing imec Publications by title

X-ray microdiffraction measurements to support epitaxial growth studies of strained Ge-cap / relaxed SiGe on STI nano-scale patterned Si wafers

Loo, Roger; Shimura, Yosuke; Sun, Jianwu; Ike, Shinichi; Inuzuka, Yuuki; Nakatsuka, Osau; Zaima, Shigeaki; Imai, Yasuhiko; Kimura, Shigeru (2015)

X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates

Ebihara, K.; Harada, S.; Kikkawa, J.; Nakamura, Y.; Sakai, A.; Wang, Gang; Caymax, Matty; Imai, Y.; Kimura, S.; Sakata, O. (2010)

X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates

Ebihara, K.; Harada, S.; Kikkawa, J.; Nakamura, Y.; Sakai, A.; Wang, Gang; Caymax, Matty; Imai, Y.; Kimura, S.; Sakata, O. (2010)

X-ray phase contrast simulation for grating-based interferometry using GATE

Sanctorum, Jonathan; De Beenhouwer, Jan; Sijbers, Jan (2020)

X-ray phase-contrast simulations of fibrous phantoms using GATE

Sanctorum, Jonathan; De Beenhouwer, Jan; Sijbers, Jan (2018-11)

X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy

El-Kazzi, Mario; Grenet, Genevieve; Merckling, Clement; Saint-Girons, Guillaume; Botella, Claude; Marty, Olivier; Hollinger, Guy (2009)

X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface

Conard, Thierry; Kondoh, Eiichi; De Witte, Hilde; Maex, Karen; Vandervorst, Wilfried (1999)

X-ray photoelectron spectroscopy characterisation of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface

Vitchev, R.G.; Pireaux, J.J.; Conard, Thierry; Bender, Hugo; Wolstenholme, J.; Defranoux, C. (2004)

X-ray studies of group III-nitride quantum wells with high quality interfaces

Jacobs, Koen; Moerman, Ingrid (2000)

X-ray tomographic micro-particle velocimetry in porous media

Bultreys, T.; Van Offenwert, S.; Goethals, W.; Boone, M. N.; Cnudde, V.; Aelterman, Jan (2022)

X-valley influence on hot free electron absorption and optical nonlinearities at 10.6μm in highly doped n-GaAs

Shkerdin, G.; Stiens, J.; Vounckx, Roger (2002)

X10D: Efficient, low-cost, stable tandem organic devices

Aernouts, Tom (2012)

X10D: Efficient, low-cost, stable tandem organic devices

Aernouts, Tom (2012)

XANES and EXAFS study of P doped diamond

Shikata, S.; Yamaguchi, K.; Fujiwara, A.; Tamenori, Y.; Tsuruta, K.; Yamada, T.; Nicley, Shannon; Haenen, Ken; Koizumi, S. (2018)

XAS photoresists electron/quantum yields study with synchrotron light

De Schepper, Peter; Vaglio Pret, Alessandro; Hansen, Terje; Giglia, Angelo; Hoshiko, Kenji; Mani, Antonio; Biafore, John J. (2015)

XOR of PRPs in a quantum world

Mennink, Bart; Szepieniec, Alan (2017)

XPS Al K-a and high energy x-ray photoelectron spectroscopy (HAXPES) Cr K-a measurement of bulk boron

Zborowski, Charlotte; Vanleenhove, Anja; Hoflijk, Ilse; Vaesen, Inge; Artyushkova, K.; Conard, Thierry (2023)

XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers

Conard, Thierry; De Witte, Hilde; Loo, Roger; Verheyden, P.; Vandervorst, Wilfried; Caymax, Matty; Gijbels, Renaat (1999)

XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers

Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Caymax, Matty; Loo, Roger; Verheyen, P.; Gijbels, Renaat (1998)

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

Detriche, S.; Vivegnis, Sabastien; Vanhumbeeck, J.-F.; Felten, A.; Louette, P.; Renner, Frank; Delhalle, J.; Mekhalif, Z. (2020)