Recently added

Electron channeling contrast imaging: potential for future metrology in semiconductor industry

Vystavel, Tomas; Prokhodtseva, Anna; Schulze, Andreas; Caymax, Matty (2016)

A low power 40 Gbit/s cascaded extension to bit-interleaving optical networks enabling next-generation metro/access connectivity

Vyncke, Arno; Torfs, Guy; Verbeke, Marijn; Van Praet, C.; Chow, H. K.; Suvakovic, D.; Duque, A.; Yin, Xin (2016)

Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study

Vrancken, Nandi; Vereecke, Guy; Bal, Stef; Sergeant, Stefanie; Doumen, Geert; Holsteyns, Frank; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2016)

In-situ wetting characterization of silicon nanopillars

Vrancken, Nandi; Sergeant, Stefanie; Doumen, Geert; Holsteyns, Frank; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2016)

Superhydrophobic breakdown of nanostructured surfaces characterized in situ using ATR-FTIR

Vrancken, Nandi; Sergeant, Stefanie; Vereecke, Guy; Doumen, Geert; Holsteyns, Frank; Terryn, Herman; De Gendt, Stefan; Xu, XiuMei (2016)

Benchmarking Ge1-xSnx CVD Epitaxy using GeH4 and Ge2H6

Vohra, Anurag; Loo, Roger; Kohen, David; Margetis, Joe; Tolle, John; Stange, Daniela; Buca, Dan; Vandervorst, Wilfried (2016-11)

n-Type P-NCD: electrochemical and in-situ Raman spectroelectrochemical study

Vlckova Zivcova, Z.; Frank, O.; Drijkoningen, Sien; Haenen, Ken; Mortet, Vincent; Kavan, L. (2016)

Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs

Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini Der Agopian, Paula; Martino, Joao Antonio; Mitard, Jerome; Witters, Liesbeth; Langer, Robert; Collaert, Nadine; Claeys, Cor; Thean, Aaron (2016)

Low frequency noise and fin width study of Si passivated Ge pFinFETs

Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini Der Agopian, Paula; Martino, Joao Antonio; Mitard, Jerome; Witters, Liesbeth; Langer, Robert; Collaert, Nadine; Claeys, Cor; Thean, Aaron (2016)

Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes

Vinicius de Oliveira, Alberto; Simoen, Eddy; Ghedini der Agopian, Paula; Martino, Joao Antonio; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Claeys, Cor (2016)

Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures

Vinicius de Oliveira, Alberto; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron (2016)

Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs

Vinicius de Oliveira, Alberto; Agopian, G.D.; Martino, J.; Simoen, Eddy; Claeys, Cor; Mertens, Hans; Collaert, Nadine; Thean, Aaron (2016)

Non-linearity of the dissolution behaviour in Extreme UV photoresists

Vesters, Yannick; De Simone, Danilo (2016)

Non-Linearity of the dissolution in advanced EUV photoresist

Vesters, Yannick; De Simone, Danilo (2016)

Beer on a chip: identification of superior industrial yeasts using droplet microfluidics

Vervoort, Yannick; Wiederkehr, Rodrigo Sergio; Stakenborg, Tim; Lagae, Liesbet; Verstrepen, Kevin (2016)

A historical perspective on bacterial persistence

Verstraeten, Natalie; Knapen, Wouter; Fauvart, Maarten; Michiels, Jan (2016)

Impact of structure and homo-coupling of the central donor unit of small molecule organic semiconductors on solar cell performance

Verstappen, Pieter; Cardinaletti, Ilaria; Vangerven, Tim; Vanormelingen, Wouter; Verstraeten, Frederik; Lutsen, Laurence; Vanderzande, Dirk; Manca, Jean; Maes, Wouter (2016)

imec Publications: Recent submissions

Electron channeling contrast imaging: potential for future metrology in semiconductor industry

A low power 40 Gbit/s cascaded extension to bit-interleaving optical networks enabling next-generation metro/access connectivity

Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study

In-situ wetting characterization of silicon nanopillars

Superhydrophobic breakdown of nanostructured surfaces characterized in situ using ATR-FTIR

Benchmarking Ge1-xSnx CVD Epitaxy using GeH4 and Ge2H6

n-Type P-NCD: electrochemical and in-situ Raman spectroelectrochemical study

Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs

Low frequency noise and fin width study of Si passivated Ge pFinFETs

Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes

Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures

Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs

Non-linearity of the dissolution behaviour in Extreme UV photoresists

Non-Linearity of the dissolution in advanced EUV photoresist

Beer on a chip: identification of superior industrial yeasts using droplet microfluidics

A historical perspective on bacterial persistence

Impact of structure and homo-coupling of the central donor unit of small molecule organic semiconductors on solar cell performance

Uniform strain in heterostructure tunnel field-effect transistors

Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors

The tunnel field-effect transistor

imec Publications: Recent submissions

Electron channeling contrast imaging: potential for future metrology in semiconductor industry ﻿

A low power 40 Gbit/s cascaded extension to bit-interleaving optical networks enabling next-generation metro/access connectivity ﻿

Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study ﻿

In-situ wetting characterization of silicon nanopillars ﻿

Superhydrophobic breakdown of nanostructured surfaces characterized in situ using ATR-FTIR ﻿

Benchmarking Ge1-xSnx CVD Epitaxy using GeH4 and Ge2H6 ﻿

n-Type P-NCD: electrochemical and in-situ Raman spectroelectrochemical study ﻿

Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs ﻿

Low frequency noise and fin width study of Si passivated Ge pFinFETs ﻿

Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes ﻿

Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures ﻿

Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs ﻿

Non-linearity of the dissolution behaviour in Extreme UV photoresists ﻿

Non-Linearity of the dissolution in advanced EUV photoresist ﻿

Beer on a chip: identification of superior industrial yeasts using droplet microfluidics ﻿

A historical perspective on bacterial persistence ﻿

Impact of structure and homo-coupling of the central donor unit of small molecule organic semiconductors on solar cell performance ﻿

Uniform strain in heterostructure tunnel field-effect transistors ﻿

Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors ﻿

The tunnel field-effect transistor ﻿

Electron channeling contrast imaging: potential for future metrology in semiconductor industry

A low power 40 Gbit/s cascaded extension to bit-interleaving optical networks enabling next-generation metro/access connectivity

Pattern collapse of high-aspect-ratio silicon nanostructures - A parametric study

In-situ wetting characterization of silicon nanopillars

Superhydrophobic breakdown of nanostructured surfaces characterized in situ using ATR-FTIR

Benchmarking Ge1-xSnx CVD Epitaxy using GeH4 and Ge2H6

n-Type P-NCD: electrochemical and in-situ Raman spectroelectrochemical study

Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs

Low frequency noise and fin width study of Si passivated Ge pFinFETs

Impact of the low temperature operation on long channel strained Ge pFinFETs fabricated with STI first and last processes

Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures

Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETs

Non-linearity of the dissolution behaviour in Extreme UV photoresists

Non-Linearity of the dissolution in advanced EUV photoresist

Beer on a chip: identification of superior industrial yeasts using droplet microfluidics

A historical perspective on bacterial persistence

Impact of structure and homo-coupling of the central donor unit of small molecule organic semiconductors on solar cell performance

Uniform strain in heterostructure tunnel field-effect transistors

Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors

The tunnel field-effect transistor