Browsing Conference contributions by author "Padovani, Andrea"
Now showing items 1-4 of 4
-
Defect spectroscopy from electrical measurements: a simulation based technique
Larcher, Luca; Padovani, Andrea; Pramanik, Dipankar; Kaczer, Ben; Palumbo, Felix (2018) -
Role of defects in the reliability of HfO2/Si-based spacer dielectric stacks for local interconnects
Wu, Chen; Vaisman Chasin, Adrian; Padovani, Andrea; Lesniewska, Alicja; Demuynck, Steven; Croes, Kristof (2019) -
Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
Vandelli, Luca; Arreghini, Antonio; Padovani, Andrea; Larcher, Luca; Van den Bosch, Geert; Della Marca, Vincenzo; Pavan, Paolo; Jurczak, Gosia; Van Houdt, Jan (2010) -
Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers
Padovani, Andrea; Pesic, Milan; Anik Kumar, Mondol; Blomme, Pieter; Subirats, Alexandre; Vadakupudhu Palayam, Senthil; Baten, Zunaid; Larcher, Luca; Van den Bosch, Geert (2019)