Browsing Conference contributions by author "Pace, C."
Now showing items 1-5 of 5
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A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Mercha, Abdelkarim; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009)