Browsing Conference contributions by imec author "d109a021c6fb64242f67bb94eaadb98193010177"
Now showing items 1-20 of 27
-
Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space
Bury, Erik; Vaisman Chasin, Adrian; Chuang, Kent; Vandemaele, Michiel; Van Beek, Simon; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri (2019) -
BEOL compatible high retention perpendicular SOT-RAM device for SRAM replacement and AiMC
Couet, Sebastien; Rao, Siddharth; Van Beek, Simon; Nguyen, Van Dai; Garello, Kevin; Jayakumar, Ganesh; Costa, Diogo; Cai, Kaiming; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar (2021) -
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021) -
Electrical switching properties in asymmetric MTJs for logic applications
Raymenants, Eline; Manfrini, Mauricio; Vaysset, Adrien; Swerts, Johan; Van Beek, Simon; Heyns, Marc; Nikonov, D.E.; Sasikanth, M; Young, I.A.; Mocuta, Dan; Radu, Iuliana (2017) -
Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations
Bury, Erik; Kaczer, Ben; Van Beek, Simon; Linten, Dimitri (2018) -
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
First demonstration of field-free perpendicular SOT-MRAM for ultrafast and high-density embedded memories
Cai, Kaiming; Talmelli, Giacomo; Fan, Kaiquan; Van Beek, Simon; Kateel, Vaishnavi; Gupta, Mohit; Gama Monteiro Junior, Maxwel; Ben Chroud, Mohamed; Jayakumar, Ganesh; Trovato, Anna; Rao, Siddharth; Kar, Gouri Sankar; Couet, Sebastien (2022) -
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Donadio, Gabriele Luca; Swerts, Johan; Mertens, Sofie; Kar, Gouri Sankar; Min, Tai; Groeseneken, Guido (2015) -
Impact of ambient temperature on the switching behavior of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Yasin, Farrukh; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2020) -
Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
Van Beek, Simon; Martens, Koen; Roussel, Philippe; Couet, Sebastien; Souriau, Laurent; Swerts, Johan; Kim, Woojin; Rao, Siddharth; Mertens, Sofie; Lin, Tsann; Crotti, Davide; Degraeve, Robin; Bury, Erik; Linten, Dimitri; Kar, Gouri Sankar; Groeseneken, Guido (2017) -
Impact of self-heating on reliability predictions in STT-MRAM
Van Beek, Simon; O'Sullivan, Barry; Roussel, Philippe; Degraeve, Robin; Bury, Erik; Swerts, Johan; Couet, Sebastien; Souriau, Laurent; Kundu, Shreya; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Low Tc, low Ms CoFeBX alloy as free layer material for high performance perpendicular MRAM stack
Couet, Sebastien; Rao, Siddharth; Swerts, Johan; Van Beek, Simon; Sankaran, Kiroubanand; Carpenter, Robert; Mertens, Sofie; Kim, Woojin; Crotti, Davide; Kar, Gouri Sankar (2019) -
Magnetic domain walls: from physics to devices
Raymenants, Eline; Wan, Danny; Couet, Sebastien; Canvel, Yann; Thiam, Arame; Tsvetanova, Diana; Souriau, Laurent; Asselberghs, Inge; Carpenter, Robert; Jossart, Nico; Manfrini, Mauricio; Vaysset, A.; Bultynck, Olivier; Van Beek, Simon; Heyns, Marc; Nikonov, D. E.; Young, I. A.; Ghosh, S.; Vila, L.; Garello, K.; Pizzini, S.; Nguyen, Van Dai; Radu, Iuliana (2021) -
MTJ degradation in multi-pillar SOT-MRAM with selective writing
Van Beek, Simon; Cai, Kaiming; Fan, Kaiquan; Talmelli, Giacomo; Trovato, Anna; Jossart, Nico; Rao, Siddharth; Vaisman Chasin, Adrian; Couet, Sebastien (2023) -
MTJ degradation in SOT-MRAM by self-heating-induced diffusion
Van Beek, Simon; Cai, Kaiming; Rao, Siddharth; Jayakumar, Ganesh; Couet, Sebastien; Jossart, Nico; Vaisman Chasin, Adrian; Kar, Gouri Sankar (2022) -
Solving the BEOL compatibility challenge of top-pinned magnetic tunnel junction stacks
Swerts, Johan; Liu, Enlong; Couet, Sebastien; Mertens, Sofie; Rao, Siddharth; Kim, Woojin; Garello, Kevin; Souriau, Laurent; Kundu, Shreya; Crotti, Davide; Yasin, Farrukh; Jossart, Nico; Sakhare, Sushil; Devolder, Thibaut; Van Beek, Simon; O'Sullivan, Barry; Van Elshocht, Sven; Furnemont, Arnaud; Kar, Gouri Sankar (2017) -
SOT-MRAM 300mm integration for low power and ultrafast embedded memories
Garello, Kevin; Yasin, Farrukh; Couet, Sebastien; Souriau, Laurent; Swerts, Johan; Rao, Siddharth; Van Beek, Simon; Kim, Woojin; Liu, Enlong; Kundu, Shreya; Tsvetanova, Diana; Jossart, Nico; Croes, Kristof; Grimaldi, Eva; Baumgartner, Manuel; Crotti, Davide; Furnemont, Arnaud; Gambardella, Pietro; Kar, Gouri Sankar (2018) -
SOT-MRAM 300mm integration for low power and ultrafast embedded memories
Garello, Kevin; Yasin, Farrukh; Couet, Sebastien; Vudya Sethu, Kiran Kumar; Souriau, Laurent; Swerts, Johan; Rao, Siddharth; Van Beek, Simon; Kim, Woojin; Liu, Enlong; Kundu, Shreya; Tsvetanova, Diana; Jossart, Nico; Croes, Kristof; Grimaldi, Eva; Baumgartner, Manuel; Crotti, Davide; Furnemont, Arnaud; Gambardella, Pietro; Kar, Gouri Sankar (2018) -
SOT-MRAM based Analog in-Memory Computing for DNN inference
Doevenspeck, Jonas; Garello, Kevin; Verhoef, Bram; Degraeve, Robin; Van Beek, Simon; Crotti, Davide; Yasin, Farrukh; Couet, Sebastien; Jayakumar, Ganesh; Papistas, Ioannis; Debacker, Peter; Lauwereins, Rudy; Dehaene, Wim; Kar, Gouri Sankar; Cosemans, Stefan; Mallik, Arindam; Verkest, Diederik (2020) -
STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application
Rao, Siddharth; Kim, Woojin; Van Beek, Simon; Kundu, Shreya; Perumkunnil, Manu; Cosemans, Stefan; Yasin, Farrukh; Couet, Sebastien; Carpenter, Robert; O'Sullivan, Barry; Houshmand Sharifi, Shamin; Jossart, Nico; Souriau, Laurent; Goux, Ludovic; Crotti, Davide; Kar, Gouri Sankar (2021)