Browsing Conference contributions by imec author "d23927b222340d87a72b2f763865ad2f743c2712"
Now showing items 21-29 of 29
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Ni(Pt) silicide with improved thermal stability for application in DRAM PERI or RMG devices
Schram, Tom; Spessot, Alessio; Ritzenthaler, Romain; Rosseel, Erik; Caillat, Christian; Horiguchi, Naoto; Fazan, Pierre (2013) -
Off-state stress degradation mechanism on advanced p-MOSFETs
Cho, Moon Ju; Spessot, Alessio; Kaczer, Ben; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre; Horiguchi, Naoto; Linten, Dimitri (2015-06) -
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
Simoen, Eddy; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Claeys, Cor; Mendes Almeida, Luciano; Andrada, Gloria; Luque Rodrigues, Abraham; Jimenez Tejada, Juan Antonio; Caillat, Christian; Fazan, Pierre (2012) -
Optimized process simulation of USJ for HKMG DRAM periphery transistors
Spessot, Alessio; Caillat, Christian; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre (2014) -
Reliability engineering enabling continued logic for memory device scaling
O'Sullivan, Barry; Ritzenthaler, Romain; Dentoni Litta, Eugenio; Simoen, Eddy; Machkaoutsan, Vladimir; Fazan, Pierre; Ji, Yunhyuck; Kim, Cheolgyu; Spessot, Alessio; Linten, Dimitri; Horiguchi, Naoto (2019) -
Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs
Spessot, Alessio; Ritzenthaler, Romain; Schram, Tom; Aoulaiche, Marc; Cho, Moon Ju; Toledano Luque, Maria; Horiguchi, Naoto; Fazan, Pierre (2015) -
Thermal budget impact on HKMG Al2O3 and La-based stacks for 2x DRAM periphery transistors
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Na, Hoon Jo; Lee, Sun Ghil; Son, Yunik; Noh, Kyung Bong; Aoulaiche, Marc; Arimura, Hiroaki; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2014) -
Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
Son, Yunik; Noh, Kyung Bong; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Fazan, Pierre; Cho, Moon Ju; Franco, Jacopo; Horiguchi, Naoto; Thean, Aaron (2014) -
Understanding workfunction tuning in HKMG by Lanthanum diffusion combining simulations and measurements
Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Ritzenthaler, Romain; Schram, Tom (2013)