Browsing Conference contributions by author "Rafi, J.M."
Now showing items 1-13 of 13
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Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Hayama, K.; Rafi, J.M.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Kuboyama, S.; Oka, K.; Matsuda, S. (2004) -
Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Effective lifetime of minority carriers in silicon: the role of heat- and hydrogen plasma treatments
Ulyashin, A.; Simoen, Eddy; Carnel, Lodewijk; De Wolf, Stefaan; Dekkers, Harold; Rafi, J.M.; Beaucarne, Guy; Poortmans, Jef; Claeys, Cor (2004) -
Electrical and opical characterization of thin semiconductor layers for advanced ULSI devices
Simoen, Eddy; Claeys, Cor; Gaubas, E.; Rafi, J.M. (2005) -
Enhancement of "linear kink effect" in fully depleted SOI n-MOSFETs at liquid nitrogen temperature
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2004) -
Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors
Rafi, J.M.; Cardona-Safont, L.; Zabala, M.; Boulord, C.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, Eddy; Claeys, Cor (2008) -
Evaluation of the channel engineering impact on the analog performance of deep-submicron partially depleted SOI MOSFETs at low temperatures
Hayama, K.; Ohyama, H.; Takakura, K.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2004) -
Germanium doping of Si substrates for improved device characteristics and yield
Vanhellemont, Jan; Chen, J.; Xu, W.; Yang, D.; Rafi, J.M.; Ohyama, H.; Simoen, Eddy (2010) -
Hydrogen-plasma-enhanced thermal donor formation in n-type high-ressitivity MCZ silicon
Simoen, Eddy; Huang, Y.L.; Claeys, Cor; Rafi, J.M.; Job, R.; Fahrner, W.R.; Versluijs, Janko; Clauws, P. (2005) -
Physical characterization and reliability aspects of MuGFETs
Claeys, Cor; Simoen, Eddy; Rafi, J.M.; Pavanello, M.A.; Martino, J.A. (2007) -
Reliability performance characterization of SOI FinFETs
Claeys, Cor; Put, Sofie; Rafi, J.M.; Pavanello, J.M.; Martino, J.A.; Simoen, Eddy (2009) -
What do we know about hydrogen-induced thermal donors?
Simoen, Eddy; Huang, Y.L.; Ma, Y.; Lauwaert, J.; Clauws, P.; Rafi, J.M.; Ulyashin, A.; Claeys, Cor (2008)