Browsing Conference contributions by title

Economics of semiconductor scaling – a cost analysis for advanced technology node

Mallik, Arindam; Ryckaert, Julien; Kim, Ryan Ryoung han; Debacker, Peter; Decoster, Stefan; Lazzarino, Frederic; Ritzenthaler, Romain; Horiguchi, Naoto; Verkest, Diederik; Mocuta, Anda (2019)

EDA role in the design-technology co-optimization towards N7

Mattii, Luca; Raghavan, Praveen; Debacker, Peter; Berekovic, Mladen; Gerousis, Vassilios (2016)

EDA solutions to new-defect detection in advanced process technologies

Marinissen, Erik Jan; Vandling, Gilbert; Goel, Sandeep; Hapke, Friedrich; Rivers, Jason; Mittermaier, Nikolaus; Bahl, Swapnil (2012)

Edge Anomaly Detection Framework for AIOps in Cloud and IoT

Moens, Pieter; Andriessen, Bavo; Sebrechts, Merlijn; Volckaert, Bruno; Van Hoecke, Sofie (2023)

Edge detection in static and dynamic environments using robot swarms

Khaluf, Yara (2017)

Edge enhancement in optical images at different orders of acousto-optic Bragg diffraction

Kotov, V.M.; Stiens, J.; Ayukhanov, R.A.; Shkerdin, G.N.; Vounckx, Roger (2007)

Edge placement error analysis for N7 logic patterning options

van Setten, Eelco; Psara, Eleni; Wittebrood, Friso; Oorschot, Dorothe; van Dijk, Joep; Schiffelers, Guido; Finders, Jo; Dusa, Mircea; Philipsen, Vicky; Hendrickx, Eric (2015)

Edge roughness as a source of crosstalk in optical space switches

Maat, D. H. P.; Leenders, A.; Zhu, Y. C.; Groen, F. H.; van brug, H.; Herben, C. G. P.; Frankena, H. J.; Moerman, Ingrid (1998)

Edge trimming for wafer-to-wafer 3D integration

Inoue, Fumihiro; Visker, Jakob; Jourdain, Anne; Moeller, Berthold; Yokoyama, Kaori; Peng, Lan; Kosemura, Daisuke; De Wolf, Ingrid; Rebibis, Kenneth June; Miller, Andy; Beyne, Eric; Sleeckx, Erik (2016)

Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021)

Education for the deep submicron age: business as usual

De Man, Hugo (1997)

EELS analyses of metal-inserted high-k dielectric stacks

MacKenzie, M.; Craven, A.J.; McComb, D.W.; McGilvery, C.M.; McFadzean, S.; De Gendt, Stefan (2008)

Efail: breaking S/MIME and OpenPGP email encryption using Exfiltration channels

Poddebniak, Damian; Dresen, Christian; Muller, jens; Ising, Fabian; Schinzel, Sebastian; Friedberger, Simon (2018)

Effect of thick ground on the performance of slot coupled circularly polarized patch antenna

Aliakbarian, Hadi; Enayati, Amin; Vandenbosch, Guy; De Raedt, Walter (2010)

Effect of 1-D nano-confinement on the kinetics of a click-chemistry surface reaction used in biosensors

Vereecke, Guy; Debruyn, Haroen; De Keyzer, Quinten; Vos, Rita; Dutta, Abhishek; Holsteyns, Frank (2018)

Effect of 147 nm radiation on a 2.0 porous organo-Silicon glass

de Marneffe, Jean-Francois; Lukaszewicz, Mikolaj; Porter, Stephen; Zhang, Liping; Heyne, Markus; Baklanov, Mikhaïl (2013)

Effect of 147nm photons on porous Organo-Silicon Glass materials and damage improvement by optimized Cu/low-k integration approaches

Zhang, Liping; de Marneffe, Jean-Francois; Lukaszewicz, Mikolaj; Barry-Porter, Stephen; Vajda, Felim; Sun, Yiting; Heyne, Markus; Baklanov, Mikhaïl; Rutiqlian, Vito (2014)