Recently added

Cryogenic Temperature Effects on 16nm FinFet Performance and Mismatch

Catapano, Edoardo; Grill, Alexander; Saraza Canflanca, Pablo; Diaz Fortuny, Javier; Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; de Greve, Kristiaan; Afanasiev, Valeri (2024)

Study of the Magnetoelectric Effect in PVDF/Ni Composites

Luciano, Federica; De Coster, Arne; Giorgione, Erika; Wysocka, Dominika; De Gendt, Stefan; Ciubotaru, Florin; Adelmann, Christoph (2024)

Investigation of Graphene Cap Formation on NiAl by Low Temperature Thermal CVD

Temmyo, Yumehito; Soulie, Jean-Philippe; Adelmann, Christoph; Tokei, Zsolt; Ueno, Kazuyoshi (2024)

Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

Hellemans, Thomas; Verreck, Devin; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; Houssa, Michel; Van Houdt, Jan (2024)

FINE-TUNING SELF-SUPERVISED MODELS FOR LANGUAGE IDENTIFICATION USING ORTHONORMAL CONSTRAINT

Prasad, Amrutha; Carofilis, Andres; Vanderreydt, Geoffroy; Khalil, Driss; Madikeri, Srikanth; Motlicek, Petr; Schuepbach, Christof (2024)

Radar-Network-Based Odometry and Elevation Estimation

Trombetta, Francesco; Al baba, Adnan; Bauduin, Marc; Sahli, Hichem; Bourdoux, André (2024)

Gesture Detection Using IEEE 802.15.4z-Compliant Impulse Radio UWB Radar System

Farsaei, Ashkan; Meyer, Bernard; Zhou, Liwei; Sheikh, Alireza; Kasanadi Ramachandra, Gururaja; Kumbu, Utku; El Soussi, Mohieddine; Zhao, Peng (2024)

A DC stable, well-conditioned and low-frequency regularized time-domain PMCHWT equation

Le, Van Chien; Andriulli, Francesco P.; Cools, Kristof (2024)

Extreme UV Self-Aligned Double Patterning process optimization for BEOL interconnections on 3nm nodes and beyond

Montero Alvarez, Daniel; Buccheri, Nunzio; Lin, Quyang; Roy, Syamashree; Paolillo, Sara; Wu, Chen; Hermans, Yannick; Decoster, Stefan; Baudemprez, Bart; Finoulst, Jan-Frederik; Lazzarino, Frederic; Park, Seongho; Tokei, Zsolt (2024)

Patterning spacer source drain cavities in CFET devices

Choudhury, Subhobroto; Mannaert, Geert; Petersen Barbosa Lima, Lucas; Demuynck, Steven; Koo, Il Gyo; Lazzarino, Frederic (2024)

MicroLED Display on 300mm CMOS Platform - Crosstalk and Optical Outcoupling

Steudel, Soeren; Vertommen, Johan; Le Boulbar, Emmanuel; Buscemi, Giuseppe; Bach, Lars; Van Huylenbroeck, Stefaan; Kang, Shuo; De Vos, Joeri; Miller, Andy; Osman, Haris; Rebibis, Kenneth June (2023-05-23)

EUV single patterning validation of curvilinear routing

Treska, Fergo; Xu, Dongbo; Gillijns, Werner; Sherazi, Yasser (2023-04-28)

Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking

Rip, Jens; Derakhshandeh, Jaber; Negishi, Ryo; Tomatsu, Itsuro; Cuypers, Dieter H.; Beyne, Eric (2024)

3D interconnects for quantum computing

Derakhshandeh, Jaber; Dangol, Anish; Hussain, Tassawar; Stegmann, Heiko; Ananthapadmanabha Rao, Vadiraj; Dhakras, Prathamesh; Witters, Thomas; Shafahian, Ehsan; Mudigere Krishne Gowda, Punith; Gerets, Carine; Radisic, Alex; Vaquilar, Aldrin; Goehnermeier, Aksel; Wan, Danny; Miller, Andy; Jourdain, Anne; Cherman, Vladimir; Beyer, Gerald; Beyne, Eric; De Greve, Kristiaan (2024)

Collective die-to-wafer assembly process for optically interconnected System-on-wafer

Kennes, Koen; Dvoretskii, Anton; Podpod, Arnita; Xu, Pengfei; He, Junwen; Lepage, Guy; Golshani, Negin; Verheyen, Peter; Magdziak, Rafal; Bipul, Swetanshu; Phommahaxay, Alain; Chakrabarti, Maumita; Miller, Andy; Beyne, Eric; Ban, Yoojin; Ferraro, Filippo; van Campenhout, Joris (2024)

Conference contributions: Recent submissions

Cryogenic Temperature Effects on 16nm FinFet Performance and Mismatch

Study of the Magnetoelectric Effect in PVDF/Ni Composites

Investigation of Graphene Cap Formation on NiAl by Low Temperature Thermal CVD

Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

FINE-TUNING SELF-SUPERVISED MODELS FOR LANGUAGE IDENTIFICATION USING ORTHONORMAL CONSTRAINT

Radar-Network-Based Odometry and Elevation Estimation

Gesture Detection Using IEEE 802.15.4z-Compliant Impulse Radio UWB Radar System

A DC stable, well-conditioned and low-frequency regularized time-domain PMCHWT equation

Extreme UV Self-Aligned Double Patterning process optimization for BEOL interconnections on 3nm nodes and beyond

Patterning spacer source drain cavities in CFET devices

MicroLED Display on 300mm CMOS Platform - Crosstalk and Optical Outcoupling

EUV single patterning validation of curvilinear routing

Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking

3D interconnects for quantum computing

Collective die-to-wafer assembly process for optically interconnected System-on-wafer

Spin Wave Threshold Majority Gate

Spin Wave Majority Gates Cascading by Gilbert Damping Embracement (Can the Devil be turned into an Angel?)

SiGe selective etching to enable bottom and middle dielectric isolations for advanced gate-all-around FET architecture

Monitoring of Trace Molecular Impurities in Clean-Room Air

Challenges for spacer and source/drain cavity patterning in CFET devices

Conference contributions: Recent submissions

Cryogenic Temperature Effects on 16nm FinFet Performance and Mismatch ﻿

Study of the Magnetoelectric Effect in PVDF/Ni Composites ﻿

Investigation of Graphene Cap Formation on NiAl by Low Temperature Thermal CVD ﻿

Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping ﻿

FINE-TUNING SELF-SUPERVISED MODELS FOR LANGUAGE IDENTIFICATION USING ORTHONORMAL CONSTRAINT ﻿

Radar-Network-Based Odometry and Elevation Estimation ﻿

Gesture Detection Using IEEE 802.15.4z-Compliant Impulse Radio UWB Radar System ﻿

A DC stable, well-conditioned and low-frequency regularized time-domain PMCHWT equation ﻿

Extreme UV Self-Aligned Double Patterning process optimization for BEOL interconnections on 3nm nodes and beyond ﻿

Patterning spacer source drain cavities in CFET devices ﻿

MicroLED Display on 300mm CMOS Platform - Crosstalk and Optical Outcoupling ﻿

EUV single patterning validation of curvilinear routing ﻿

Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking ﻿

3D interconnects for quantum computing ﻿

Collective die-to-wafer assembly process for optically interconnected System-on-wafer ﻿

Spin Wave Threshold Majority Gate ﻿

Spin Wave Majority Gates Cascading by Gilbert Damping Embracement (Can the Devil be turned into an Angel?) ﻿

SiGe selective etching to enable bottom and middle dielectric isolations for advanced gate-all-around FET architecture ﻿

Monitoring of Trace Molecular Impurities in Clean-Room Air ﻿

Challenges for spacer and source/drain cavity patterning in CFET devices ﻿

Cryogenic Temperature Effects on 16nm FinFet Performance and Mismatch

Study of the Magnetoelectric Effect in PVDF/Ni Composites

Investigation of Graphene Cap Formation on NiAl by Low Temperature Thermal CVD

Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

FINE-TUNING SELF-SUPERVISED MODELS FOR LANGUAGE IDENTIFICATION USING ORTHONORMAL CONSTRAINT

Radar-Network-Based Odometry and Elevation Estimation

Gesture Detection Using IEEE 802.15.4z-Compliant Impulse Radio UWB Radar System

A DC stable, well-conditioned and low-frequency regularized time-domain PMCHWT equation

Extreme UV Self-Aligned Double Patterning process optimization for BEOL interconnections on 3nm nodes and beyond

Patterning spacer source drain cavities in CFET devices

MicroLED Display on 300mm CMOS Platform - Crosstalk and Optical Outcoupling

EUV single patterning validation of curvilinear routing

Wet Cu passivation for high throughput fluxless Thermal Compression Bonding of Cu-Sn μbumps for Die-to-Wafer stacking

3D interconnects for quantum computing

Collective die-to-wafer assembly process for optically interconnected System-on-wafer

Spin Wave Threshold Majority Gate

Spin Wave Majority Gates Cascading by Gilbert Damping Embracement (Can the Devil be turned into an Angel?)

SiGe selective etching to enable bottom and middle dielectric isolations for advanced gate-all-around FET architecture

Monitoring of Trace Molecular Impurities in Clean-Room Air

Challenges for spacer and source/drain cavity patterning in CFET devices