Recently added

Random additive control flow error detection

Vankeirsbilck, Jens; Penneman, Niels; Hallez, Hans; Boydens, Jeroen (2018)

Release the Kraken: New KRACKs in the 802.11 standard

Vanhoef, Mathy; Piessens, Frank (2018)

Symbolic execution of security protocol implementations: handling cryptographic primitives

Vanhoef, Mathy; Piessens, Frank (2018)

Operating channel validation: Preventing multi-channel man-in-the-middle attacks against protected wi-fi networks

Vanhoef, Mathy; Bhandaru, Nehru; Derham, Thomas; Ouzieli, Ido; Piessens, Frank (2018)

Magnetic reorientation in anisotropic Heisenberg ferromagnets

Vanherck, Joren; Soree, Bart; Magnus, Wim (2018-09)

Key challenges and opportunities for 3D sequential integration

Vandooren, Anne; Witters, Liesbeth; Franco, Jacopo; Mallik, Arindam; Parvais, Bertrand; Wu, Zhicheng; Li, Waikin; Rosseel, Erik; Hikavyy, Andriy; Peng, Lan; Rassoul, Nouredine; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Waldron, Niamh; Boemmels, Juergen; De Heyn, Vincent; Mocuta, Dan; Ryckaert, Julien; Collaert, Nadine (2018-10)

Sequential 3D: Key integration challenges and opportunities for advanced semiconductor scaling

Vandooren, Anne; Witters, Liesbeth; Franco, Jacopo; Mallik, Arindam; Parvais, Bertrand; Wu, Z.; Walke, Amey; Deshpande, Paru; Rosseel, Erik; Hikavyy, Andriy; Li, Waikin; Peng, L.; Rassoul, Nouredine; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Zheng, T.; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018)

First demonstration of 3D stacked Finfets at a 45nm fin pitch and 110nm gate pitch technology on 300mm wafers

Vandooren, Anne; Franco, Jacopo; Wu, Zhicheng; Parvais, Bertrand; Li, Waikin; Walke, Amey; Peng, Lan; Deshpande, Paru; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Zheng, T.; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Mannaert, Geert; Chan, BT; Ritzenthaler, Romain; Mitard, Jerome; Ragnarsson, Lars-Ake; Waldron, Niamh; De Heyn, Vincent; Demuynck, Steven; Boemmels, Juergen; Mocuta, Dan; Ryckaert, Julien; Collaert, Nadine (2018)

3D sequential stacked planar devices on 300 mm wafers featuring replacement metal gate junction-less top devices processed at 525°C with improved reliability

Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018)

SMURFF: a high-performance framework for matrix factorization

Vander Aa, Tom; Ashby, Tom (2018)

Virtual screening on FPGA: first experiments

Vander Aa, Tom (2018-11)

A systematic performance comparison of ultra low-power AES S-boxes

Vandenabeele, Thomas; Uytterhoeven, Roel; Dehaene, Wim; Mentens, Nele (2018)

Distribution function based simulations of hot-carrier degradation in nanowire FETs

Vandemaele, Michiel; Kaczer, Ben; Stanojevic, Zlatan; Tyaginov, Stanislav; Makarov, Alexander; Vaisman Chasin, Adrian; Mertens, Hans; Linten, Dimitri; Groeseneken, Guido (2018)

Artifact detection of wrist photoplethysmograph signals

Vandecasteele, Kaat; Lazaro, Jesus; Cleeren, Evy; Claes, Kasper; Van Paesschen, Wim; Van Huffel, Sabine; Hunyadi, Borbala (2018)

The maximum covering cycle problem

Vancroonenburg, W; Grosso, A; Salassa, F (2018)

Effectiveness of data triplication in harsh electromagnetic environments

Van Waes, Jonas; Vankeirsbilck, Jens; Lannoo, Jonas; Pissoort, Davy; Boydens, Jeroen (2018)

Effectiveness of hamming single error correction codes under harsh eectromagnetic disturbances

Van Waes, Jonas; Lannoo, Jonas; Vankeirsbilck, Jens; Degraeve, Andy; Peuteman, Joan; Vanoost, Dries; Pissoort, Davy; Boydens, Jeroen (2018)

Measurement and characterization of dual-band LoRa communication in the Antarctic

Van Torre, Patrick; Gaelens, J.; Verhaevert, Jo; Rogier, Hendrik (2018-04)

Body-worn channel characterization unit for the 868 MHz band

Van Torre, Patrick; Agneessens, Sam; Verhaevert, Jo; Rogier, Hendrik (2018-04)

Photonics North 2018

Van Thourhout, Dries (2018)

Conference contributions: Recent submissions

Random additive control flow error detection ﻿

Release the Kraken: New KRACKs in the 802.11 standard ﻿

Symbolic execution of security protocol implementations: handling cryptographic primitives ﻿

Operating channel validation: Preventing multi-channel man-in-the-middle attacks against protected wi-fi networks ﻿

Magnetic reorientation in anisotropic Heisenberg ferromagnets ﻿

Key challenges and opportunities for 3D sequential integration ﻿

Sequential 3D: Key integration challenges and opportunities for advanced semiconductor scaling ﻿

First demonstration of 3D stacked Finfets at a 45nm fin pitch and 110nm gate pitch technology on 300mm wafers ﻿

3D sequential stacked planar devices on 300 mm wafers featuring replacement metal gate junction-less top devices processed at 525°C with improved reliability ﻿

SMURFF: a high-performance framework for matrix factorization ﻿

Virtual screening on FPGA: first experiments ﻿

A systematic performance comparison of ultra low-power AES S-boxes ﻿

Distribution function based simulations of hot-carrier degradation in nanowire FETs ﻿

Artifact detection of wrist photoplethysmograph signals ﻿

The maximum covering cycle problem ﻿

Effectiveness of data triplication in harsh electromagnetic environments ﻿

Effectiveness of hamming single error correction codes under harsh eectromagnetic disturbances ﻿

Measurement and characterization of dual-band LoRa communication in the Antarctic ﻿

Body-worn channel characterization unit for the 868 MHz band ﻿

Photonics North 2018 ﻿