Recently added

On-chip reservoir photonic computing with integrated optical readout

Freiberger, Matthias; Katumba, Andrew; Bienstman, Peter; Dambre, Joni (2017)

Self focusing SIMS: a new metrology for the analysis of confined volumes

Franquet, Alexis; Douhard, Bastien; Morris, Richard; Spampinato, Valentina; Conard, Thierry; Vandervorst, Wilfried (2017)

ToF-SIMS - SPM combined analysis for real 3D depth profiling of heterogeneous microelectronic structures

Franquet, Alexis; Barnes, Jean-Paul; Spampinato, Valentina; Moreno Villavicencio, M.A.; Chevalier, N.; Conard, Thierry; Vandervorst, Wilfried (2017)

EPE analysis of sub-N10 BEOL structures with Coventor's SEMulator3D

Franke, Joern-Holger; Murdoch, Gayle; Halder, Sandip (2017)

Single exposure EUV block downscaling for metal pitches below 32nm

Franke, Joern-Holger; Colsters, Paul; Bekaert, Joost; Hendrickx, Eric; Wittebrood, F.; Pathak, Abhinav; Schiffelers, Guido (2017)

Gate stack thermal stability and PBTI reliability challenges for 3D sequential integration: demonstration of a suitable gate stack for top and bottom tier nMOS

Franco, Jacopo; Witters, Liesbeth; Vandooren, Anne; Arimura, Hiroaki; Sioncke, Sonja; Putcha, Vamsi; Vais, Abhitosh; Xie, Qi; Givens, Michael; Tang, Fu; Jiang, X.; Subirats, Alexandre; Vaisman Chasin, Adrian; Ragnarsson, Lars-Ake; Kaczer, Ben; Linten, Dimitri; Collaert, Nadine (2017)

Characterization of oxide defects in InGaAs MOS gate stacks for high-mobility n-channel MOSFETs

Franco, Jacopo; Putcha, Vamsi; Vais, Abhitosh; Sioncke, Sonja; Waldron, Niamh; Zhou, Daisy; Rzepa, Gerhard; Roussel, Philippe; Groeseneken, Guido; Heyns, Marc; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2017)

Electrical resistance measurements of individual nanometer-wide Si fins

Folkersma, Steven; Bogdanowicz, Janusz; Schulze, Andreas; Petersen, D.H.; Hansen, O.; Henrichsen, H.; Nielsen, P.F.; Vandervorst, Wilfried (2017)

Electric vehicle use in public fleets: The case of the Genoa University

Foiadelli, F.; Longo, M.; Delfino, F.; Bracco, S.; Spina, Domenico; Dhaene, Tom (2017-10)

Decrease in adolescents' figural memory performance associated with cumulative brain dose over one year

Foerster, Milena; Thielens, Arno; Joseph, Wout; Röösli, Martin (2017-06)

Decreases in adolescents' figural memory performance associated with cumulative individual radiowave brain dose over one year

Foerster, Milena; Thielens, Arno; Joseph, Wout; Eeftens, Marloes; Dongus, Stefan; Röösli, Martin (2017-09)

Probing of large-array, fine-pitch microbumps for 3D ICs

Fodor, Ferenc; De Wachter, Bart; Marinissen, Erik Jan; Kiesewetter, Joerg; Smith, Ken (2017-05)

First demonstration of vertically stacked ferroelectric Al doped HfO2 devices for NAND applications

Florent, Karine; Lavizzari, Simone; Di Piazza, Luca; Popovici, Mihaela Ioana; Vecchio, Emma; Potoms, Goedele; Groeseneken, Guido; Van Houdt, Jan (2017)

From planar to vertical capacitors : a first step towards ferroelectric V-FeFET integration

Florent, Karine; Lavizzari, Simone; Di Piazza, Luca; Popovici, Mihaela Ioana; Potoms, Goedele; Raymaekers, Tom; Groeseneken, Guido; Van Houdt, Jan (2017)

Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy

Fleischmann, Claudia; Paredis, Kristof; Melkonyan, Davit; Bogdanowicz, Janusz; Morris, Richard; Cuduvally, Ramya; Vandervorst, Wilfried (2017)

Atom probe tomography for advanced semiconductor technology research

Fleischmann, Claudia; Melkonyan, Davit; Arnoldi, Laurent; Morris, Richard; Bogdanowicz, Janusz; Vandervorst, Wilfried (2017)

One micron redistribution for fan-out wafer level packaging

Flack, Warren; Hsieh, Robert; Nguyen, Ha-Ai; Slabbekoorn, John; Lorant, Christophe; Miller, Andy (2017)

Electrical and optical simulation of nPERT solar cells with epitaxially grown emitters

Filipic, Miha; Recaman Payo, Maria; Bearda, Twan; Depauw, Valerie; Sivaramakrishnan Radhakrishnan, Hariharsudan; Van Nieuwenhuysen, Kris; Kuzma Filipek, Izabela; Duerinckx, Filip; Debucquoy, Maarten; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2017-09)

Fast and reliable measurement modules for advanced narrow-band sensing applications in the millimeter wave domain

Fievet, Nathalie; Zhang, Yuchen; Stiens, Johan (2017)

Combining instance and feature neighbors for efficient multi-label classification

Feremans, Len; Cule, Boris; Vens, Celine; Goethals, Bart (2017)

Conference contributions: Recent submissions

On-chip reservoir photonic computing with integrated optical readout ﻿

Self focusing SIMS: a new metrology for the analysis of confined volumes ﻿

ToF-SIMS - SPM combined analysis for real 3D depth profiling of heterogeneous microelectronic structures ﻿

EPE analysis of sub-N10 BEOL structures with Coventor's SEMulator3D ﻿

Single exposure EUV block downscaling for metal pitches below 32nm ﻿

Gate stack thermal stability and PBTI reliability challenges for 3D sequential integration: demonstration of a suitable gate stack for top and bottom tier nMOS ﻿

Characterization of oxide defects in InGaAs MOS gate stacks for high-mobility n-channel MOSFETs ﻿

Electrical resistance measurements of individual nanometer-wide Si fins ﻿

Electric vehicle use in public fleets: The case of the Genoa University ﻿

Decrease in adolescents' figural memory performance associated with cumulative brain dose over one year ﻿

Decreases in adolescents' figural memory performance associated with cumulative individual radiowave brain dose over one year ﻿

Probing of large-array, fine-pitch microbumps for 3D ICs ﻿

First demonstration of vertically stacked ferroelectric Al doped HfO2 devices for NAND applications ﻿

From planar to vertical capacitors : a first step towards ferroelectric V-FeFET integration ﻿

Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy ﻿

Atom probe tomography for advanced semiconductor technology research ﻿

One micron redistribution for fan-out wafer level packaging ﻿

Electrical and optical simulation of nPERT solar cells with epitaxially grown emitters ﻿

Fast and reliable measurement modules for advanced narrow-band sensing applications in the millimeter wave domain ﻿

Combining instance and feature neighbors for efficient multi-label classification ﻿