Recently added

An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors

Hikavyy, Andriy; Witters, Liesbeth; Mitard, Jerome; Vanherle, Wendy; Vandervorst, Wilfried; Dekoster, Johan; Loo, Roger; Caymax, Matty (2012)

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

Hikavyy, Andriy; Vanherle, Wendy; Witters, Liesbeth; Vincent, Benjamin; Dekoster, Johan; Loo, Roger (2012)

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

Hikavyy, Andriy; Vanherle, Wendy; Witters, Liesbeth; Vincent, Benjamin; Dekoster, Johan; Loo, Roger (2012)

Challenges for introducing Ge and III/V devices into CMOS technologies

Heyns, Marc; Alian, AliReza; Brammertz, Guy; Caymax, Matty; Eneman, Geert; Franco, Jacopo; Gencarelli, Federica; Groeseneken, Guido; Hellings, Geert; Hikavyy, Andriy; Houssa, Michel; Kaczer, Ben; Lin, Dennis; Loo, Roger; Merckling, Clement; Meuris, Marc; Mitard, Jerome; Nyns, Laura; Sioncke, Sonja; Vandervorst, Wilfried; Vincent, Benjamin; Waldron, Niamh; Witters, Liesbeth (2012)

Progress in EUV Lithography towards manufacturing from an exposure tool perspective

Hermans, Jan; Laidler, David; Foubert, Philippe; D'have, Koen; Cheng, Shaunee; Hendrickx, Eric; Dusa, Mircea (2012)

Flexible OLED displays using low-temperature IGZO backplanes

Heremans, Paul; Nag, Manoj; Steudel, Soeren; Vicca, Peter; Smout, Steve; Ke, Tung Huei; Ameys, Marc; Schols, Sarah; Genoe, Jan; Tripathi, Ashutosh; van der Putten, Bas; van der Steen, Jan-Laurens; Tempelaars, Karin; Cobb, Brian; Yakimets, Iryna; Gelinck, Gerwin (2012)

Organic and oxide thin-film transistors applied in displays and circuits on foil

Heremans, Paul (2012)

ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling

Hellings, Geert; Linten, Dimitri; Thijs, Steven; Chen, Shih-Hung; Witters, Liesbeth; Mitard, Jerome; Zografos, Odysseas; Groeseneken, Guido (2012)

ESD characterization of hgh mobility SiGe quantum well and Ge devices for future CMOS scaling

Hellings, Geert; Linten, Dimitri; Thijs, Steven; Chen, Shih-Hung; Witters, Liesbeth; Mitard, Jerome; Groeseneken, Guido (2012)

Poly-SiGe-based CMUT array with high acoustical pressure

Helin, Philippe; Czarnecki, Piotr; Verbist, Agnes; Bryce, George; Rottenberg, Xavier; Severi, Simone (2012)

Bubble size distribution analysis and control in high frequency ultrasonic cleaning processes

Hauptmann, Marc; Struyf, Herbert; Mertens, Paul; Heyns, Marc; De Gendt, Stefan; Glorieux, Christ; Brems, Steven (2012)

The importance of control over bubble size distribution in pulsed megasonic cleaning

Hauptmann, Marc; Struyf, Herbert; Mertens, Paul; Heyns, Marc; De Gendt, Stefan; Glorieux, Christ; Brems, Steven (2012)

InGaAsSb/GaSb lasers and photodetectors integrated on a silicon-on-insulator waveguide circuit for spectroscopic applications

Hattasan, Nannicha; Gassenq, Alban; Cerutti, L.; Rodrigez, J.B.; Tournie, E.; Roelkens, Gunther (2012)

Conference contributions: Recent submissions

An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

Challenges for introducing Ge and III/V devices into CMOS technologies

Progress in EUV Lithography towards manufacturing from an exposure tool perspective

Flexible OLED displays using low-temperature IGZO backplanes

Organic and oxide thin-film transistors applied in displays and circuits on foil

ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling

ESD characterization of hgh mobility SiGe quantum well and Ge devices for future CMOS scaling

Poly-SiGe-based CMUT array with high acoustical pressure

Bubble size distribution analysis and control in high frequency ultrasonic cleaning processes

The importance of control over bubble size distribution in pulsed megasonic cleaning

InGaAsSb/GaSb lasers and photodetectors integrated on a silicon-on-insulator waveguide circuit for spectroscopic applications

A 7-to-10b 0-to-4MS/s flexible SAR ADC with 6.5-to-16fJ/conversion-step

Calibration of ultra low-power time-interleaved SAR ADCs

Time-interleaved SAR and slope converters

A 0.7V 7-to-10bit 0-to-2MS/s flexible SAR ADC for ultra low-power wireless sensor nodes

Three-dimensional electrical profiling of carbon nanotube interconnects

Identifying data-dependent system scenarios in a dynamic embedded system

Integrated differential pressure sensor in silicon-on-insulator

Conference contributions: Recent submissions

An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors ﻿

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors ﻿

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors ﻿

Challenges for introducing Ge and III/V devices into CMOS technologies ﻿

Progress in EUV Lithography towards manufacturing from an exposure tool perspective ﻿

Flexible OLED displays using low-temperature IGZO backplanes ﻿

Organic and oxide thin-film transistors applied in displays and circuits on foil ﻿

ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling ﻿

ESD characterization of hgh mobility SiGe quantum well and Ge devices for future CMOS scaling ﻿

Poly-SiGe-based CMUT array with high acoustical pressure ﻿

Bubble size distribution analysis and control in high frequency ultrasonic cleaning processes ﻿

The importance of control over bubble size distribution in pulsed megasonic cleaning ﻿

InGaAsSb/GaSb lasers and photodetectors integrated on a silicon-on-insulator waveguide circuit for spectroscopic applications ﻿

A 7-to-10b 0-to-4MS/s flexible SAR ADC with 6.5-to-16fJ/conversion-step ﻿

Calibration of ultra low-power time-interleaved SAR ADCs ﻿

Time-interleaved SAR and slope converters ﻿

A 0.7V 7-to-10bit 0-to-2MS/s flexible SAR ADC for ultra low-power wireless sensor nodes ﻿

Three-dimensional electrical profiling of carbon nanotube interconnects ﻿

Identifying data-dependent system scenarios in a dynamic embedded system ﻿

Integrated differential pressure sensor in silicon-on-insulator ﻿

An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

High Ge content SiGe selective processes for manufacturing source/drain in the next generations of pMOS transistors

Challenges for introducing Ge and III/V devices into CMOS technologies

Progress in EUV Lithography towards manufacturing from an exposure tool perspective

Flexible OLED displays using low-temperature IGZO backplanes

Organic and oxide thin-film transistors applied in displays and circuits on foil

ESD characterization of high mobility SiGe quantum well and Ge devices for future CMOS scaling

ESD characterization of hgh mobility SiGe quantum well and Ge devices for future CMOS scaling

Poly-SiGe-based CMUT array with high acoustical pressure

Bubble size distribution analysis and control in high frequency ultrasonic cleaning processes

The importance of control over bubble size distribution in pulsed megasonic cleaning

InGaAsSb/GaSb lasers and photodetectors integrated on a silicon-on-insulator waveguide circuit for spectroscopic applications

A 7-to-10b 0-to-4MS/s flexible SAR ADC with 6.5-to-16fJ/conversion-step

Calibration of ultra low-power time-interleaved SAR ADCs

Time-interleaved SAR and slope converters

A 0.7V 7-to-10bit 0-to-2MS/s flexible SAR ADC for ultra low-power wireless sensor nodes

Three-dimensional electrical profiling of carbon nanotube interconnects

Identifying data-dependent system scenarios in a dynamic embedded system

Integrated differential pressure sensor in silicon-on-insulator