EISBN
978-1-6654-7950-9
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents
Publication type
Proceedings paper