Browsing Articles by imec author "9d08ce44a18b5b256c8aadda23aea22fca6cfefa"
Now showing items 1-14 of 14
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3D sequential stacked planar devices featuring low-temperature replacement metal gate junctionless top devices with improved reliability
Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018-11) -
A 0.65-to-1.4 nJ/burst 3-to-10 GHz UWB all-digital TX in 90 nm CMOS for IEEE 802.15.4a
Ryckaert, Julien; Van der Plas, Geert; De Heyn, Vincent; Desset, Claude; Van Poucke, Bart; Craninckx, Jan (2007) -
A CMOS ultra-wideband receiver for low data-rate communication
Ryckaert, Julien; Verhelst, M.; Badaroglu, Mustafa; D'Amico, S.; De Heyn, Vincent; Desset, Claude; Nuzzo, Pierluigi; Van Poucke, Bart; Wambacq, Piet; Baschirotto, A.; Dehaene, Wim; Van der Plas, Geert (2007) -
Characterization and modeling of transient device behavior under CMD ESD stress
Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2004) -
First demonstration of vertically stacked gate-all-around highly strained germanium nanowire pFETs
Capogreco, Elena; Witters, Liesbeth; Arimura, Hiroaki; Sebaai, Farid; Porret, Clément; Hikavyy, Andriy; Loo, Roger; Milenin, Alexey; Eneman, Geert; Favia, Paola; Bender, Hugo; Wostyn, Kurt; Dentoni Litta, Eugenio; Schulze, Andreas; Vrancken, Christa; Opdebeeck, Ann; Mitard, Jerome; Langer, Robert; Holsteyns, Frank; Waldron, Niamh; Barla, Kathy; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018-11) -
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices
Vassilev, Vesselin; Jenei, Snezana; Groeseneken, Guido; Venegas, Rafael; Thijs, Steven; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Steyaert, M.; Maes, Herman (2003) -
Influence of gate length on ESD-performance for deep submicron CMOS technology
Bock, Karlheinz; Keppens, Bart; De Heyn, Vincent; Groeseneken, Guido; Ching, L. Y.; Naem, Abdalla (2001) -
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices
Hiblot, Gaspard; Parihar, Narendra; Dupuy, Emmanuel; Mannaert, Geert; Baudot, Sylvain; Kaczer, Ben; Franco, Jacopo; Vandooren, Anne; De Heyn, Vincent; Mercha, Abdelkarim (2021) -
Record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
Arimura, Hiroaki; Cott, Daire; Boccardi, Guillaume; Loo, Roger; Wostyn, Kurt; Witters, Liesbeth; Conard, Thierry; Suhard, Samuel; van Dorp, Dennis; Dekkers, Harold; Ragnarsson, Lars-Ake; Mitard, Jerome; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine; Horiguchi, Naoto (2019) -
Significance of the failure criterion on transmission line pulse testing
Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido (2002) -
Strained germanium gate-all-around pMOS device demonstration using selective wire release etch prior to replacement metal gate deposition
Witters, Liesbeth; Arimura, Hiroaki; Sebaai, Farid; Hikavyy, Andriy; Milenin, Alexey; Loo, Roger; De Keersgieter, An; Eneman, Geert; Schram, Tom; Wostyn, Kurt; Devriendt, Katia; Schulze, Andreas; Lieten, Ruben; Bilodeau, S; Cooper, E; Storck, Peter; Chiu, Eddy; Vrancken, Christa; Favia, Paola; Vancoille, Eric; Mitard, Jerome; Langer, Robert; Opdebeeck, Ann; Holsteyns, Frank; Waldron, Niamh; Barla, Kathy; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2017) -
Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005) -
The potential of FinFETs for analog and RF circuit applications
Wambacq, Piet; Verbruggen, Bob; Scheir, Karen; Borremans, Jonathan; Dehan, Morin; Linten, Dimitri; De Heyn, Vincent; Van der Plas, Geert; Mercha, Abdelkarim; Parvais, Bertrand; Gustin, Cedric; Subramanian, Vaidy; Collaert, Nadine; Jurczak, Gosia; Decoutere, Stefaan (2007) -
Ultra-wideband transmitter for low power wireless body area networks: design and comparison to narrowband solutions
Ryckaert, Julien; Desset, Claude; Fort, Andrew; Badaroglu, Mustafa; De Heyn, Vincent; Wambacq, Piet; Van der Plas, Geert; Donnay, Stephane; Van Poucke, Bart; Gyselinckx, Bert (2005-12)