Browsing Articles by title

Oxide and interface degradation and breakdown under medium and high field injection conditions: a correlation study

Degraeve, Robin; Groeseneken, Guido; De Wolf, Ingrid; Maes, Herman (1995)

Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K

Van den bosch, G.; Groeseneken, Guido; Maes, Herman; Klein, R.; Saks, N. S. (1994)

Oxide electronics: like wildfire

Hardy, An; Van Bael, Marlies (2011)

Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques

De Gryse, O.; Clauws, P.; Van Landuyt, J.; Lebedev, O.; Claeys, Cor; Simoen, Eddy; Vanhellemont, Jan (2002)

Oxide trapping in InGaAs-Al2O3 system and the role of sulfur in reducing the Al2O3 trap density

Alian, AliReza; Brammertz, Guy; Degraeve, Robin; Cho, Moon Ju; Merckling, Clement; Lin, Dennis; Wang, Wei-E; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2012)

Oxide-confined laser diodes with an integrated spot-size converter

De Mesel, Kurt; Verstuyft, Steven; Moerman, Ingrid; Van Daele, Peter; Baets, Roel (2002)

Oxide-nitride-oxide layer optimisation for reliable embedded SONOS memories

van Schaijk, Rob; Van Duuren, Michiel; Mei, Wan Yuet; Van der Jeugd, Kees; Rothschild, Aude; Demand, Marc (2004)

OxRRAM-Based Analog in-Memory Computing for Deep Neural Network Inference: A Conductance Variability Study

Doevenspeck, Jonas; Degraeve, Robin; Fantini, Andrea; Cosemans, Stefan; Mallik, Arindam; Debacker, Peter; Verkest, Diederik; Lauwereins, Rudy; Dehaene, Wim (2021)

Oxygen chemiluminescence in He plasma as a method for plasma damage evaluation of Low-k dielectrics

Urbanowicz, Adam; Shamiryan, Denis; Baklanov, Mikhaïl; De Gendt, Stefan (2008)

Oxygen Defect Stability in Amorphous, C-Axis Aligned, and Spinel IGZO

van Setten, Michiel; Dekkers, Harold; Kljucar, Luka; Mitard, Jerome; Pashartis, Christopher; Subhechha, Subhali; Rassoul, Nouredine; Delhougne, Romain; Kar, Gouri Sankar; Pourtois, Geoffrey (2021)

Oxygen Gas and UV Barrier Properties of Nano-ZnO-Coated PET and PHBHHx Materials Fabricated by Ultrasonic Spray-Coating Technique

Abbas, Mohsin; Buntinx, Mieke; Deferme, Wim; Reddy, Naveen; Peeters, Roos (2021)

Oxygen gettering cap to scavenge parasitic oxide interlayer in TiSi contacts

Yu, Hao; Schaekers, Marc; Wang, Linlin; Everaert, Jean-Luc; Jiang, Yu-Long; Mocuta, Dan; Horiguchi, Naoto; Collaert, Nadine; De Meyer, Kristin (2019-11)

Oxygen incorporation in TiN for metal gate work function tuning with a replacement gate integration approach

Li, Zilan; Schram, Tom; Witters, Thomas; Tseng, Joshua; De Gendt, Stefan; De Meyer, Kristin (2010)

Oxygen scavenging by Ta spacers in double-MgO free layers for perpendicular spin-transfer torque magnetic random-access memory

Couet, Sebastien; Swerts, Johan; Mertens, Sofie; Lin, Tsann; Tomczak, Yoann; Liu, Enlong; Douhard, Bastien; Van Elshocht, Sven; Furnemont, Arnaud; Kar, Gouri Sankar (2016)