Browsing Articles by title

Quantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides

Hope, A.; Nguyen, T.G.; Mitchell, A.; Bogaerts, Wim (2016)

Quantitative analysis of trace metals in silicon nitride films by a vapor phase decomposition/solution collection approach

Vereecke, Guy; Schaekers, Marc; Verstraete, Kurt; Arnauts, Sophia; Heyns, Marc; Plante, W. (2000)

Quantitative characterization of pore stuffing and unstuffing for postporosity plasma protection of low-k materials

Heyne, Markus; Zhang, Liping; Liu, Junjun; Ahmad, Iftikhar; Toma, Dorel; de Marneffe, Jean-Francois; De Gendt, Stefan; Baklanov, Mikhaïl (2014)

Quantitative depth profiling of SiGe-multilayers with the atom probe

Koelling, Sebastian; Gilbert, Matthieu; Goossens, Jozefien; Hikavyy, Andriy; Richard, Olivier; Vandervorst, Wilfried (2011)

Quantitative detection of corrosion minerals in carbon steel using shortwave infrared hyperspectral imaging

De Kerf, Thomas; Gestels, Arthur; Janssens, Koen; Scheunders, Paul; Steenackers, Gunther; Vanlanduit, Steve (2022)

Quantitative hemodynamic assessment of stenotic below-the-knee arteries using spatio-temporal bolus tracking on 4D-CT angiography

Boonen, Pieter Thomas; Buls, Nico; Van Gompel, Gert; Devos, Hannes; de Brucker, Yannick; Leiner, Tim; Aerden, Dimitri; de Mey, Johan; Vandemeulebroucke, Jef (2023)

Quantitative Hemodynamic Measurements in Cortical Vessels Using Functional Ultrasound Imaging

Brunner, Clement; Brunner, Clément; Mace, Emile; Montaldo, Gabriel; Urban, Alan (2022)

Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

Liu, Ziyang; Merckling, Clement; Caymax, Matty; Rooyackers, Rita; Collaert, Nadine; Thean, Aaron; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc (2015-06)

Quantitative pattern collapse metrology for 193nm immersion lithography

Winroth, Gustaf; Gronheid, Roel; Lin, Chua; Neishi, Katsumi; Harukawa, Ryota; Marcuccilli, Gino (2011)

Quantitative prediction of junction leakage in bulk-technology CMOS devices

Duffy, R.; Heringa, A.; Venezia, V.C.; Loo, Josine; Verheijen, M.A.; Hopstaken, M.J.P.; van der Tak, K.; de Potter de ten Broeck, Muriel; Hooker, J.C.; Meunier-Beillard, P.; Delhougne, R. (2010)

Quantitative retention model for filamentary oxide-based resistive RAM

Degraeve, Robin; Chen, Michael; Celano, Umberto; Fantini, Andrea; Goux, Ludovic; Linten, Dimitri; Kar, Gouri Sankar (2017)

Quantitative study of magnetotransport through a (Ga,Mn)As single ferromagnetic domain

Goennenwein, S.T.B.; Russo, S.; Morpurgo, F.A.; Klapwijk, T.W.; Van Roy, Wim; De Boeck, Jo (2005)

Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy

Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013)