Browsing Presentations by author "Maes, Herman"
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A 1Mbit HIMOS® flash memory embedded in a 0.35μm CMOS process
Van Houdt, Jan; Tsouhlarakis, Jorgo; Hendrickx, Paul; Vanhorebeek, Guido; Wellekens, Dirk; Haspeslagh, Luc; Deferm, Ludo; Maes, Herman (2000) -
A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
An inelastic quantum tunnelling model for current conduction after soft-breakdown
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Analysis of charge pumping characteristics of single interface traps
Habas, Predrag; De Wolf, Ingrid; Groeseneken, Guido; Stesmans, Andre; Maes, Herman (1997) -
Channel hot electron injection versus Fowler-Nordheim tunneling for multilevel charge storage in non-volatile memories
Montanari, Donato; Van Houdt, Jan; Wellekens, Dirk; Hendrickx, Paul; Groeseneken, Guido; Maes, Herman (1997) -
Charge pumping characterization of germanium MOSFETs
Martens, Koen; Kaczer, Ben; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2007) -
Charging instability in n-channel MOSFETs with SiO2/HfO2 gate dielectrics
Kerber, Andreas; Cartier, Eduard; Pantisano, Luigi; Degraeve, Robin; Groeseneken, Guido; Maes, Herman; Schwalke, U. (2002) -
Control of texture and crystallization in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 electrode layers
Norga, Gerd; Wouters, D. J.; Fè, Laura; Bartic, Andrei; Maes, Herman (1998) -
Control of texture and oxygen stoichiometry in reactively sputtered RuO2 electrode layers for low fatigue PZT FECAPs
Norga, Gerd; Wouters, Dirk; Conard, Thierry; Maes, Herman (1997) -
Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
De Blauwe, Jan; Degraeve, Robin; Bellens, Rudi; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1996) -
Dependency of the properties of SrxBiyTa2O9 thin films on the SR and BI stoichiometry
Viapiana, Matteo; Wouters, Dirk; Maes, Herman; Van der Biest, Omer (2004) -
Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters
Habas, Predrag; Groeseneken, Guido; Van den Bosch, Geert; Maes, Herman; Gornik, E. (1997) -
Dopant effects in sol-gel based PZT based ferroelectric memories: lanthanum vs tantalum
Fè, Laura; Wouters, D. J.; Norga, Gerd; Bartic, T. A.; Maes, Herman (1998) -
Effect of top electrode deposition conditions on the reliability of Tt/PZT/Pt ferroelectric capacitors
Wouters, Dirk; Bartic, Andrei; Norga, Gerd; Maes, Herman (1999) -
Elements of the Leakage Current of High-Epsilon Ferroelectric PZT Films
Wouters, D. J.; Willems, Geert; Groeseneken, Guido; Maes, Herman; Brooks, K. (1994) -
Ferroelectric properties and reliability issues of PLZT thin films
Fè, Laura; Wouters, Dirk; Norga, Gerd; Maes, Herman (1998) -
Impact of enhanced localized degradation on time-to-breakdown in high-k oxides
Kauerauf, Thomas; Roussel, Philippe; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (2004) -
Impact of nitridation on recoverable and permanent NBTI degradation in high-k/metal-gate pMOSFETs
Aoulaiche, Marc; Kaczer, Ben; Roussel, Philippe; Houssa, Michel; De Gendt, Stefan; Maes, Herman; Groeseneken, Guido (2008)