Browsing Presentations by author "Xu, Mingwei"
Now showing items 1-16 of 16
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Characterization of vertical resurf diodes using scanning probe microsopy
Duhayon, Natasja; Xu, Mingwei; Alvarez, David; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2002) -
High resolution dopant/carrier profiling for deep submicron technologies
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Conard, Thierry; De Witte, Hilde (1999) -
Nanometer scale carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo (2001) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Trenkler, Thomas; Xu, Mingwei (2000) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1999) -
Nanometer scale characterization of ULSI devices using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Clarysse, Trudo; Duhayon, Natasja; Xu, Mingwei; Hantschel, Thomas (2000) -
Nm-scale characterization of deep submicron devices using scanning probes
Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Clarysse, Trudo (2001) -
Probing local electrical properties in semiconductors with nanometer resolution
Vandervorst, Wilfried; Duhayon, Natasja; Eyben, Pierre; Alvarez, David; Xu, Mingwei; Fouchier, Marc; Clarysse, Trudo (2003) -
Progress towards quantitative high spatial resolution 1D and 2D carrier profiling using scanning probe techniques
Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo; Vandervorst, Wilfried (2000) -
Quantitative 2D-carrier profiling in semiconductors with sub-nm spatial resolution using SSRM
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Alvarez, David; Fouchier, Marc; Xu, Mingwei (2003) -
Towards routine, quantitative two-dimensional carrier profiling with Scanning Spreading Resistance Microscopy
Vandervorst, Wilfried; Eyben, Pierre; Callewaert, Sven; Hantschel, Thomas; Duhayon, Natasja; Xu, Mingwei; Trenkler, Thomas; Clarysse, Trudo (2000) -
Two dimensional carrier profiling with scanning capacitance microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002) -
Two-dimensional carrier profiling using scanning probe microscopy
Alvarez, David; Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Xu, Mingwei; Vandervorst, Wilfried (2002) -
Two-dimensional carrier profiling using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Fouchier, Marc; Xu, Mingwei (2002) -
Two-dimensional carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Clarysse, Trudo (2002) -
Two-dimensional dopant profiling using scanning probe microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)