Browsing Presentations by imec author "d317d0165ad319f5e79a5046012722496f473908"
Now showing items 1-20 of 21
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3D interconnect and packaging technology
Mercha, Abdelkarim (2011) -
A 90nm RF CMOS technology supported by device modelling and circuit demonstrators
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004) -
Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Matsuyama, K.; Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Digital circuit design and benchmarking for FDSOI devices: FinFET and UTBOX
Badaroglu, Mustafa; Zuber, Paul; Garcia Bardon, Marie; Miranda Corbalan, Miguel; Schuddinck, Pieter; Mercha, Abdelkarim (2012) -
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Effects of high-temperature electron irradiation on submicron MOSFETs
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2002) -
ESD evaluation of 3D SIC technology using TSV
Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Mercha, Abdelkarim; Van der Plas, Geert; Travaly, Youssef; Van Olmen, Jan; Groeseneken, Guido (2010) -
Experimental assessment of quantum effects in the low-frequency noise and RTS of deep submicron MOSFETs
Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
FinFETs for analog and RF circuits
Parvais, Bertrand; Mercha, Abdelkarim; Wambacq, Piet (2008) -
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Routoure, J.M.; Guo, W.; Cretu, B.; Lartigau, I.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2008) -
Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
Simoen, Eddy; Mercha, Abdelkarim; Creten, Ybe; Merken, Patrick; De Moor, Piet; Putzeys, Jan; Claeys, Cor; Van Hoof, Chris; Mohammadzadeh, A.; Nickson, R. (2003) -
Logic CMOS scaling AND 3D Integration
Mercha, Abdelkarim (2011) -
Measurement and simulation of statistical variability in FinFETs
Mercha, Abdelkarim (2008) -
Meyer-Neldel parameter as a figure of merit for quality of thin-film-transistor active layer?
Pichon, L.; Mercha, Abdelkarim; Routoure, J. M.; Carin, R.; Bonnaud, O.; Mohammed-Brahim, T. (2002) -
Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs
Lukyanchikova, N.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Progressive degradation of TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs subjected to electrical stress
Rafi, Joan Marc; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Campabadal, Francesca; Claeys, Cor (2008) -
Radiation damage in proton-irradiated stained Si n-MOSFETs
Ohtani, T.; Hayama, K.; Takakura, K.; Kudou, T.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Radiation tolerance in HfSiON gate MOSFETs by high-energy Particles irradation
Hayama, K.; Takakura, K.; Nishimura, A.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Radiation-induced back channel leakage in MeV-proton-irradiated 0.10 mm-CMOS partially depleted SOI MOSFETs
Rafi, Joan Marc; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Mohammadzadeh, A. (2003) -
RF CMOS modelling for circuit design
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004)